Rapid perceptual image description (RaPID) method

Soren Bech*, Roelof Hamberg, Marco Nijenhuis, Kees Teunissen, Henny Looren de Jong, Paul Houben, S. K. Pramanik

*Kontaktforfatter

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

35 Citationer (Scopus)

Abstract

This paper contains a general description of the RaPID (rapid perceptual image description) method, and the results of a series of experiments on the attribute sharpness. The method aims at a rapid and perceptually meaningful description and quantification of the primary factors of image quality. The purpose of the project is primarily to develop the main dimensions of image quality, but also to determine how they combine into overall image quality, and to develop perceptual models for the main dimensions. The result of the project will be a technique that can be used to evoke, quantify, analyze and interpret subjective reactions to the characteristics of imaging systems. A preliminary experiment was conducted on sharpness related attributes of images. The results showed that the five TV sets under study had to be evaluated on 11 different terms and that they combine into two independent attribute dimensions for natural or test images. If both types of images are considered simultaneously, the 'sharpness' space consists of at least 3 dimensions. Physical measurements were used to calculate sharpness related measures (MTFs, step responses, line width) and these were correlated with the subjective results.

OriginalsprogEngelsk
TitelProceedings of SPIE - The International Society for Optical Engineering
RedaktørerBernice E. Rogowitz, Jan P. Allebach
Antal sider12
Vol/bind2657
ForlagSPIE - International Society for Optical Engineering
Publikationsdato1 jan. 1996
Sider317-328
ISBN (Trykt)081942031X, 9780819420312
DOI
StatusUdgivet - 1 jan. 1996
Udgivet eksterntJa
BegivenhedHuman Vision and Electronic Imaging - San Jose, CA, USA
Varighed: 29 jan. 19961 feb. 1996

Konference

KonferenceHuman Vision and Electronic Imaging
BySan Jose, CA, USA
Periode29/01/199601/02/1996
SponsorSPIE - Int Soc for Opt Engineering, Bellingham, WA USA

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