Reliability Assessment of Single-phase PV Inverters

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Abstrakt

This paper investigates the reliability of two types of single-phase Photo-Voltaic (PV)inverters, which are a quasi-Z-Source Inverter (qZSI)and a conventional two-stage boost-based inverter. The converters reliability is estimated by employing a mission-profile based reliability assessment approach modeling the wear-out failure of fragile components, i.e., capacitors and semiconductor devices. The obtained results reveal that the conventional two-stage inverter has better reliability compared to the qZSI due to the higher voltage and current stresses on qZSI components. Furthermore, the impact of PV array configuration on the Shoot Through (ST)state of the qZSI and consequently on its reliability is illustrated. The analysis shows that a suitable PV array configuration can improve the qZSI reliability.
OriginalsprogEngelsk
TitelProceedings of 2019 10th International Conference on Power Electronics and ECCE Asia (ICPE 2019 - ECCE Asia)
Antal sider7
UdgivelsesstedKorea
ForlagIEEE Press
Publikationsdatomaj 2019
Sider3077-3083
Artikelnummer8796895
ISBN (Trykt)978-1-7281-1612-9
ISBN (Elektronisk)978-89-5708-313-0
StatusUdgivet - maj 2019
Begivenhed2019 10th International Conference on Power Electronics and ECCE Asia (ICPE 2019 - ECCE Asia) - Busan, Sydkorea
Varighed: 27 maj 201930 maj 2019

Konference

Konference2019 10th International Conference on Power Electronics and ECCE Asia (ICPE 2019 - ECCE Asia)
LandSydkorea
ByBusan
Periode27/05/201930/05/2019
NavnInternational Conference on Power Electronics
ISSN2150-6078

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