Reliability of Capacitors and Magnetic Components in Power Electronic Applications

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Abstrakt

This paper presents the wear out related reliability studies of capacitors and magnetic components used for power electronic converters. Accelerated lifetime testing, failure mechanisms, lifetime prediction and reliability design are presented
based on the state-of-the-arts.
OriginalsprogEngelsk
TitelProceeding of 11th International Conference on Integrated Power Electronics System (CIPS 2020)
Antal sider6
ForlagVDE Verlag GMBH
Publikationsdato2020
Sider479-484
ISBN (Trykt)978-3-8007-5225-6
StatusUdgivet - 2020
BegivenhedCIPS 2020; 11th International Conference on Integrated Power Electronics Systems -
Varighed: 24 mar. 202026 mar. 2020

Konference

KonferenceCIPS 2020; 11th International Conference on Integrated Power Electronics Systems
Periode24/03/202026/03/2020

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  • Citationsformater

    Wang, H., Wang, H., & Shen, Z. (2020). Reliability of Capacitors and Magnetic Components in Power Electronic Applications. I Proceeding of 11th International Conference on Integrated Power Electronics System (CIPS 2020) (s. 479-484). VDE Verlag GMBH. https://ieeexplore.ieee.org/document/9097729