Reliability of Capacitors and Magnetic Components in Power Electronic Applications

Huai Wang; Haoran Wang; Zhan Shen

Reliability of Capacitors and Magnetic Components in Power Electronic Applications

Huai Wang
, Haoran Wang
, Zhan Shen

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

2 Citationer (Scopus)

296 Downloads (Pure)

Abstract

This paper presents the wear out related reliability studies of capacitors and magnetic components used for power electronic converters. Accelerated lifetime testing, failure mechanisms, lifetime prediction and reliability design are presented
based on the state-of-the-arts.

Originalsprog	Engelsk
Titel	Proceeding of 11th International Conference on Integrated Power Electronics System (CIPS 2020)
Antal sider	6
Forlag	VDE Verlag GMBH
Publikationsdato	2020
Sider	479-484
ISBN (Trykt)	978-3-8007-5225-6
Status	Udgivet - 2020
Begivenhed	CIPS 2020; 11th International Conference on Integrated Power Electronics Systems - Varighed: 24 mar. 2020 → 26 mar. 2020

Konference

Konference	CIPS 2020; 11th International Conference on Integrated Power Electronics Systems
Periode	24/03/2020 → 26/03/2020

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https://ieeexplore.ieee.org/document/9097729

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Citationsformater

@inproceedings{c8408a0bacfc457ca6c7ad7d16bb73fc,

title = "Reliability of Capacitors and Magnetic Components in Power Electronic Applications",

abstract = "This paper presents the wear out related reliability studies of capacitors and magnetic components used for power electronic converters. Accelerated lifetime testing, failure mechanisms, lifetime prediction and reliability design are presented based on the state-of-the-arts.",

author = "Huai Wang and Haoran Wang and Zhan Shen",

year = "2020",

language = "English",

isbn = "978-3-8007-5225-6",

pages = "479--484",

booktitle = "Proceeding of 11th International Conference on Integrated Power Electronics System (CIPS 2020)",

publisher = "VDE Verlag GMBH",

note = "CIPS 2020; 11th International Conference on Integrated Power Electronics Systems ; Conference date: 24-03-2020 Through 26-03-2020",

}

Wang, H, Wang, H & Shen, Z 2020, Reliability of Capacitors and Magnetic Components in Power Electronic Applications. i Proceeding of 11th International Conference on Integrated Power Electronics System (CIPS 2020). VDE Verlag GMBH, s. 479-484, CIPS 2020; 11th International Conference on Integrated Power Electronics Systems, 24/03/2020. <https://ieeexplore.ieee.org/document/9097729>

Reliability of Capacitors and Magnetic Components in Power Electronic Applications. / Wang, Huai; Wang, Haoran; Shen, Zhan.
Proceeding of 11th International Conference on Integrated Power Electronics System (CIPS 2020). VDE Verlag GMBH, 2020. s. 479-484.

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

TY - GEN

T1 - Reliability of Capacitors and Magnetic Components in Power Electronic Applications

AU - Wang, Huai

AU - Wang, Haoran

AU - Shen, Zhan

PY - 2020

Y1 - 2020

N2 - This paper presents the wear out related reliability studies of capacitors and magnetic components used for power electronic converters. Accelerated lifetime testing, failure mechanisms, lifetime prediction and reliability design are presented based on the state-of-the-arts.

AB - This paper presents the wear out related reliability studies of capacitors and magnetic components used for power electronic converters. Accelerated lifetime testing, failure mechanisms, lifetime prediction and reliability design are presented based on the state-of-the-arts.

M3 - Article in proceeding

SN - 978-3-8007-5225-6

SP - 479

EP - 484

BT - Proceeding of 11th International Conference on Integrated Power Electronics System (CIPS 2020)

PB - VDE Verlag GMBH

T2 - CIPS 2020; 11th International Conference on Integrated Power Electronics Systems

Y2 - 24 March 2020 through 26 March 2020

ER -

Reliability of Capacitors and Magnetic Components in Power Electronic Applications

Abstract

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