@inproceedings{20c88e75d48f4592a544ccc29c034f5f,
title = "Reproducing the “Framing” by a Sequential Stress Test",
abstract = "The “Framing” (local discoloration along cell edges) was induced by a simple sequential accelerated stress test (consisting of hygrothermal- and UV-stressors) applied to the PV modules with high OTR (oxygen transmission rate) backsheet, irrespective of the inclusion of UV-absorber in poly(ethylene-co-vinyl acetate) (EVA) encapsulant. UV-fluorescence imaging of the PV modules suggests that the spatially-inhomogeneous degradation of EVA material under UV-irradiating conditions is correlated to this “Framing” indicating an underlying common mechanism. These findings would contribute to the development of test procedures to broadly mimic the actual failures observed in fielded PV.",
keywords = "Framing, Snail trail, Ultraviolet (UV)-induced degradation, Metallization, Photovoltaic (PV) module",
author = "Tadanori Tanahahi and Keiichiro Sakurai and Tsuyoshi Shioda and William Gambogi and Nancy Phillips and Kaushik Choudhury and Spataru, {Sergiu Viorel} and David Miller and Michael Kempe and Michael Owen-Bellini and Peter Hacke",
year = "2019",
month = jun,
doi = "10.1109/PVSC40753.2019.8980920",
language = "English",
series = "I E E E Photovoltaic Specialists Conference. Conference Record",
publisher = "IEEE Press",
booktitle = "Proceedings of 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)",
note = "2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) ; Conference date: 16-06-2019 Through 21-06-2019",
}