Semiconductor switch measuring circuit

Bjørn Rannestad (Opfinder), Søren Jørgensen (Opfinder)

Publikation: Patent

Abstrakt

The invention relates to a measuring circuit facilitating monitoring of a voltage of a semiconductor switch, the measuring circuit comprises a plurality of measuring cells, wherein each of the measuring cells comprises at least one normally-on field-effect transistor, wherein each of the normally- on field-effect transistors are controlled by a gate signal from a resistor connected in series with the source connection of the normally-on field-effect transistor, and wherein a plurality of measuring cells are connected in series with the first end of the series connected measuring cells electrically connected to a terminal of the semiconductor switch and with the second end of the series connected measuring cells electrically connected to an analoge processing circuitry.

OriginalsprogEngelsk
IPCH03K17/00
PatentnummerDK201770767
LandDanmark
Prioritetsdato10/10/2016
PrioritetsnummerDK2016PA70795
StatusUdgivet - 23 apr. 2018

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