Semiconductor switch measuring circuit

The invention relates to a measuring circuit facilitating monitoring of a voltage of a semiconductor switch, the measuring circuit comprises a plurality of measuring cells, wherein each of the measuring cells comprises at least one normally-on field-effect transistor, wherein each of the normally- on field-effect transistors are controlled by a gate signal from a resistor connected in series with the source connection of the normally-on field-effect transistor, and wherein a plurality of measuring cells are connected in series with the first end of the series connected measuring cells electrically connected to a terminal of the semiconductor switch and with the second end of the series connected measuring cells electrically connected to an analoge processing circuitry.