Stitching Grid-wise Atomic Force Microscope Images

Mathias Zacho Vestergaard, Stefan Hein Bengtson, Malte Pedersen, Christian Rankl, Thomas B. Moeslund

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

Resumé

Atomic Force Microscopes (AFM) are able to capture images with a resolution in the nano metre scale. Due to this high resolution, the covered area per image is relatively small, which can be problematic when surveying a sample. A system able to stitch AFM images has been developed to solve this problem. The images exhibit tilt, offset and scanner bow, which are counteracted by subtracting a polynomial from each line. To be able to stitch the images properly template selection is done by analyzing texture and using a voting scheme. Grids of 3x3 images have been successfully leveled and stitched.
OriginalsprogEngelsk
TitelProceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP
ForlagSCITEPRESS Digital Library
Publikationsdato2016
Sider110-117
ISBN (Trykt)978-989-758-175-5
DOI
StatusUdgivet - 2016
Begivenhed11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Rome, Italien
Varighed: 26 mar. 201529 feb. 2016
http://www.grapp.visigrapp.org/

Konference

Konference11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications
LandItalien
ByRome
Periode26/03/201529/02/2016
Internetadresse

Fingerprint

Microscopes
Surveying
Textures
Polynomials

Citer dette

Vestergaard, M. Z., Bengtson, S. H., Pedersen, M., Rankl, C., & Moeslund, T. B. (2016). Stitching Grid-wise Atomic Force Microscope Images. I Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP (s. 110-117). SCITEPRESS Digital Library. https://doi.org/10.5220/0005716501100117
Vestergaard, Mathias Zacho ; Bengtson, Stefan Hein ; Pedersen, Malte ; Rankl, Christian ; Moeslund, Thomas B. / Stitching Grid-wise Atomic Force Microscope Images. Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP. SCITEPRESS Digital Library, 2016. s. 110-117
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Vestergaard, MZ, Bengtson, SH, Pedersen, M, Rankl, C & Moeslund, TB 2016, Stitching Grid-wise Atomic Force Microscope Images. i Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP. SCITEPRESS Digital Library, s. 110-117, Rome, Italien, 26/03/2015. https://doi.org/10.5220/0005716501100117

Stitching Grid-wise Atomic Force Microscope Images. / Vestergaard, Mathias Zacho; Bengtson, Stefan Hein; Pedersen, Malte; Rankl, Christian; Moeslund, Thomas B.

Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP. SCITEPRESS Digital Library, 2016. s. 110-117.

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

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Vestergaard MZ, Bengtson SH, Pedersen M, Rankl C, Moeslund TB. Stitching Grid-wise Atomic Force Microscope Images. I Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP. SCITEPRESS Digital Library. 2016. s. 110-117 https://doi.org/10.5220/0005716501100117