Stitching Grid-wise Atomic Force Microscope Images

Mathias Zacho Vestergaard; Stefan Hein Bengtson; Malte Pedersen; Christian Rankl; Thomas B. Moeslund

doi:10.5220/0005716501100117

Stitching Grid-wise Atomic Force Microscope Images

Mathias Zacho Vestergaard, Stefan Hein Bengtson, Malte Pedersen, Christian Rankl, Thomas B. Moeslund

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

Abstract

Atomic Force Microscopes (AFM) are able to capture images with a resolution in the nano metre scale. Due to this high resolution, the covered area per image is relatively small, which can be problematic when surveying a sample. A system able to stitch AFM images has been developed to solve this problem. The images exhibit tilt, offset and scanner bow, which are counteracted by subtracting a polynomial from each line. To be able to stitch the images properly template selection is done by analyzing texture and using a voting scheme. Grids of 3x3 images have been successfully leveled and stitched.

Originalsprog	Engelsk
Titel	Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP
Forlag	SCITEPRESS Digital Library
Publikationsdato	2016
Sider	110-117
ISBN (Trykt)	978-989-758-175-5
DOI	https://doi.org/10.5220/0005716501100117
Status	Udgivet - 2016
Begivenhed	11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Rome, Italien Varighed: 26 mar. 2015 → 29 feb. 2016 http://www.grapp.visigrapp.org/

Konference

Konference	11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications
Land/Område	Italien
By	Rome
Periode	26/03/2015 → 29/02/2016
Internetadresse	http://www.grapp.visigrapp.org/

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10.5220/0005716501100117

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Citationsformater

@inproceedings{24e7d47669ca42c7b77c7c1dea63db03,

title = "Stitching Grid-wise Atomic Force Microscope Images",

abstract = "Atomic Force Microscopes (AFM) are able to capture images with a resolution in the nano metre scale. Due to this high resolution, the covered area per image is relatively small, which can be problematic when surveying a sample. A system able to stitch AFM images has been developed to solve this problem. The images exhibit tilt, offset and scanner bow, which are counteracted by subtracting a polynomial from each line. To be able to stitch the images properly template selection is done by analyzing texture and using a voting scheme. Grids of 3x3 images have been successfully leveled and stitched.",

author = "Vestergaard, {Mathias Zacho} and Bengtson, {Stefan Hein} and Malte Pedersen and Christian Rankl and Moeslund, {Thomas B.}",

year = "2016",

doi = "10.5220/0005716501100117",

language = "English",

isbn = "978-989-758-175-5",

pages = "110--117",

booktitle = "Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP",

publisher = "SCITEPRESS Digital Library",

note = "11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, VISIGRAPP 2016 ; Conference date: 26-03-2015 Through 29-02-2016",

url = "http://www.grapp.visigrapp.org/",

}

Vestergaard, MZ, Bengtson, SH , Pedersen, M, Rankl, C & Moeslund, TB 2016, Stitching Grid-wise Atomic Force Microscope Images. i Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP. SCITEPRESS Digital Library, s. 110-117, 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, Rome, Italien, 26/03/2015. https://doi.org/10.5220/0005716501100117

Stitching Grid-wise Atomic Force Microscope Images. / Vestergaard, Mathias Zacho; Bengtson, Stefan Hein ; Pedersen, Malte et al.
Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP. SCITEPRESS Digital Library, 2016. s. 110-117.

Publikation: Bidrag til bog/antologi/rapport/konference proceeding › Konferenceartikel i proceeding › Forskning › peer review

TY - GEN

T1 - Stitching Grid-wise Atomic Force Microscope Images

AU - Vestergaard, Mathias Zacho

AU - Bengtson, Stefan Hein

AU - Pedersen, Malte

AU - Rankl, Christian

AU - Moeslund, Thomas B.

PY - 2016

Y1 - 2016

N2 - Atomic Force Microscopes (AFM) are able to capture images with a resolution in the nano metre scale. Due to this high resolution, the covered area per image is relatively small, which can be problematic when surveying a sample. A system able to stitch AFM images has been developed to solve this problem. The images exhibit tilt, offset and scanner bow, which are counteracted by subtracting a polynomial from each line. To be able to stitch the images properly template selection is done by analyzing texture and using a voting scheme. Grids of 3x3 images have been successfully leveled and stitched.

AB - Atomic Force Microscopes (AFM) are able to capture images with a resolution in the nano metre scale. Due to this high resolution, the covered area per image is relatively small, which can be problematic when surveying a sample. A system able to stitch AFM images has been developed to solve this problem. The images exhibit tilt, offset and scanner bow, which are counteracted by subtracting a polynomial from each line. To be able to stitch the images properly template selection is done by analyzing texture and using a voting scheme. Grids of 3x3 images have been successfully leveled and stitched.

U2 - 10.5220/0005716501100117

DO - 10.5220/0005716501100117

M3 - Article in proceeding

SN - 978-989-758-175-5

SP - 110

EP - 117

BT - Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPP

PB - SCITEPRESS Digital Library

T2 - 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications

Y2 - 26 March 2015 through 29 February 2016

ER -

Stitching Grid-wise Atomic Force Microscope Images

Abstract

Konference

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