Test bench for thermal cycling of 10 kV silicon carbide power modules

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Resumé

This paper presents a test bench for lifetime investigation of 10 kV silicon carbide power modules. The test bench subjects high voltage switching operation to the modules while power cycling. Thus both a thermal and electrical operating point is emulated. The power cycling setup features offline measurement of on-state voltages and direct real-time measurement of die surface temperatures, enabled by fiber optical sensors, which are built into the power modules. A thermal model of the module prototypes, based on the temperature measurements, is established. Independent verification steps have been made to validate the performance of the on-state voltage measurement and the thermal model. Issues are revealed in the form of common mode currents in gate drive supply, which should be remedied. Finally a new operating point for power cycling is suggested to better stress the power modules.
OriginalsprogEngelsk
TitelProceedings of 2016 18th European Conference on Power Electronics and Applications (EPE'16 ECCE Europe)
Antal sider8
Udgivelses stedKarlsruhe, Germany
ForlagIEEE
Publikationsdatosep. 2016
ISBN (Elektronisk)978-9-0758-1524-5
DOI
StatusUdgivet - sep. 2016
BegivenhedEPE'16 - ECCE: 18th European Conference on Power Electronics and Applications - Karlsruhe Town Hall (Stadthalle), Karlsruhe, Tyskland
Varighed: 5 sep. 20169 sep. 2016
Konferencens nummer: 18
http://www.epe2016.com/

Konference

KonferenceEPE'16 - ECCE: 18th European Conference on Power Electronics and Applications
Nummer18
LokationKarlsruhe Town Hall (Stadthalle)
LandTyskland
ByKarlsruhe
Periode05/09/201609/09/2016
Internetadresse

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Thermal cycling
Silicon carbide
Voltage measurement
Fiber optic sensors
Electric potential
Time measurement
Temperature measurement
Hot Temperature
Temperature

Emneord

    Citer dette

    Sønderskov, S. D., Jørgensen, A. B., Maarbjerg, A. E., Frederiksen, K. L., Munk-Nielsen, S., Beczkowski, S., & Uhrenfeldt, C. (2016). Test bench for thermal cycling of 10 kV silicon carbide power modules. I Proceedings of 2016 18th European Conference on Power Electronics and Applications (EPE'16 ECCE Europe) Karlsruhe, Germany: IEEE. https://doi.org/10.1109/EPE.2016.7695328
    Sønderskov, Simon Dyhr ; Jørgensen, Asger Bjørn ; Maarbjerg, Anders Eggert ; Frederiksen, Kristian Linding ; Munk-Nielsen, Stig ; Beczkowski, Szymon ; Uhrenfeldt, Christian. / Test bench for thermal cycling of 10 kV silicon carbide power modules. Proceedings of 2016 18th European Conference on Power Electronics and Applications (EPE'16 ECCE Europe). Karlsruhe, Germany : IEEE, 2016.
    @inproceedings{872b0e33f55a4a6884f54495214ad6c8,
    title = "Test bench for thermal cycling of 10 kV silicon carbide power modules",
    abstract = "This paper presents a test bench for lifetime investigation of 10 kV silicon carbide power modules. The test bench subjects high voltage switching operation to the modules while power cycling. Thus both a thermal and electrical operating point is emulated. The power cycling setup features offline measurement of on-state voltages and direct real-time measurement of die surface temperatures, enabled by fiber optical sensors, which are built into the power modules. A thermal model of the module prototypes, based on the temperature measurements, is established. Independent verification steps have been made to validate the performance of the on-state voltage measurement and the thermal model. Issues are revealed in the form of common mode currents in gate drive supply, which should be remedied. Finally a new operating point for power cycling is suggested to better stress the power modules.",
    keywords = "Reliability, Silicon Carbide (SiC), Power cycling",
    author = "S{\o}nderskov, {Simon Dyhr} and J{\o}rgensen, {Asger Bj{\o}rn} and Maarbjerg, {Anders Eggert} and Frederiksen, {Kristian Linding} and Stig Munk-Nielsen and Szymon Beczkowski and Christian Uhrenfeldt",
    year = "2016",
    month = "9",
    doi = "10.1109/EPE.2016.7695328",
    language = "English",
    booktitle = "Proceedings of 2016 18th European Conference on Power Electronics and Applications (EPE'16 ECCE Europe)",
    publisher = "IEEE",
    address = "United States",

    }

    Sønderskov, SD, Jørgensen, AB, Maarbjerg, AE, Frederiksen, KL, Munk-Nielsen, S, Beczkowski, S & Uhrenfeldt, C 2016, Test bench for thermal cycling of 10 kV silicon carbide power modules. i Proceedings of 2016 18th European Conference on Power Electronics and Applications (EPE'16 ECCE Europe). IEEE, Karlsruhe, Germany, Karlsruhe, Tyskland, 05/09/2016. https://doi.org/10.1109/EPE.2016.7695328

    Test bench for thermal cycling of 10 kV silicon carbide power modules. / Sønderskov, Simon Dyhr; Jørgensen, Asger Bjørn; Maarbjerg, Anders Eggert ; Frederiksen, Kristian Linding; Munk-Nielsen, Stig; Beczkowski, Szymon; Uhrenfeldt, Christian.

    Proceedings of 2016 18th European Conference on Power Electronics and Applications (EPE'16 ECCE Europe). Karlsruhe, Germany : IEEE, 2016.

    Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

    TY - GEN

    T1 - Test bench for thermal cycling of 10 kV silicon carbide power modules

    AU - Sønderskov, Simon Dyhr

    AU - Jørgensen, Asger Bjørn

    AU - Maarbjerg, Anders Eggert

    AU - Frederiksen, Kristian Linding

    AU - Munk-Nielsen, Stig

    AU - Beczkowski, Szymon

    AU - Uhrenfeldt, Christian

    PY - 2016/9

    Y1 - 2016/9

    N2 - This paper presents a test bench for lifetime investigation of 10 kV silicon carbide power modules. The test bench subjects high voltage switching operation to the modules while power cycling. Thus both a thermal and electrical operating point is emulated. The power cycling setup features offline measurement of on-state voltages and direct real-time measurement of die surface temperatures, enabled by fiber optical sensors, which are built into the power modules. A thermal model of the module prototypes, based on the temperature measurements, is established. Independent verification steps have been made to validate the performance of the on-state voltage measurement and the thermal model. Issues are revealed in the form of common mode currents in gate drive supply, which should be remedied. Finally a new operating point for power cycling is suggested to better stress the power modules.

    AB - This paper presents a test bench for lifetime investigation of 10 kV silicon carbide power modules. The test bench subjects high voltage switching operation to the modules while power cycling. Thus both a thermal and electrical operating point is emulated. The power cycling setup features offline measurement of on-state voltages and direct real-time measurement of die surface temperatures, enabled by fiber optical sensors, which are built into the power modules. A thermal model of the module prototypes, based on the temperature measurements, is established. Independent verification steps have been made to validate the performance of the on-state voltage measurement and the thermal model. Issues are revealed in the form of common mode currents in gate drive supply, which should be remedied. Finally a new operating point for power cycling is suggested to better stress the power modules.

    KW - Reliability

    KW - Silicon Carbide (SiC)

    KW - Power cycling

    U2 - 10.1109/EPE.2016.7695328

    DO - 10.1109/EPE.2016.7695328

    M3 - Article in proceeding

    BT - Proceedings of 2016 18th European Conference on Power Electronics and Applications (EPE'16 ECCE Europe)

    PB - IEEE

    CY - Karlsruhe, Germany

    ER -

    Sønderskov SD, Jørgensen AB, Maarbjerg AE, Frederiksen KL, Munk-Nielsen S, Beczkowski S et al. Test bench for thermal cycling of 10 kV silicon carbide power modules. I Proceedings of 2016 18th European Conference on Power Electronics and Applications (EPE'16 ECCE Europe). Karlsruhe, Germany: IEEE. 2016 https://doi.org/10.1109/EPE.2016.7695328