Test setup for accelerated test of high power IGBT modules with online monitoring of Vce and Vf voltage during converter operation

Angel Ruiz de Vega, Pramod Ghimire, Kristian Bonderup Pedersen, Ionut Trintis, Szymon Beczkowski, Stig Munk-Nielsen, Bjørn Rannestad, Paul Bach Thøgersen

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

20 Citationer (Scopus)

Abstrakt

Several accelerated test methods exist in order to study the failures mechanisms of the high power IGBT modules like temperature cycling test or power cycles based on DC current pulses. The main drawback is that the test conditions do not represent the real performance and stress conditions of the device in real application. The hypothesis is that ageing of power modules closer to real environment including cooling system, full dc-link voltage and continuous PWM operation could lead to more accurate study of failure mechanism. A new type of test setup is proposed, which can create different real load conditions like in the field. Furthermore, collector-emitter voltage (Vce) has been used as indicator of the wear-out of the high power IGBT module. The innovative monitoring system implemented in the test setup is capable of measure the Vce and forward voltage of the antiparallel diode (Vf) during converter operation, which is also demonstrated.
OriginalsprogEngelsk
TitelProceedings of the 2014 International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA)
Antal sider6
UdgivelsesstedHiroshima, Japan
ForlagIEEE Press
Publikationsdato18 maj 2014
Sider2547-2553
DOI
StatusUdgivet - 18 maj 2014
Begivenhed2014 International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA) - Hiroshima, Japan
Varighed: 18 maj 201421 maj 2014

Konference

Konference2014 International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA)
LandJapan
ByHiroshima
Periode18/05/201421/05/2014

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