Thermal resistance modelling and design optimization of PCB vias

Yanfeng Shen, Huai Wang, Frede Blaabjerg

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

6 Citationer (Scopus)
22 Downloads (Pure)

Abstract

Various reference printed circuit board (PCB) thermal designs have been provided by semiconductor manufacturers and researchers. However, the recommendations are not optimal, and there are some discrepancies among them, which may confuse electrical engineers. This paper aims to develop an analytical thermal model for PCB vias, and further to find the optimal design for thermal resistance minimization. Firstly, the vertical thermal resistance of a PCB via array is analytically modelled. Then the dependence of the thermal resistance on multiple design parameters is analysed, and the optimal via diameter is found for different PCB specifications. Finally, the developed thermal model and optimal trajectory are verified by computational fluid dynamics (CFD) simulations and experiments.
OriginalsprogEngelsk
TidsskriftMicroelectronics Reliability
Vol/bind88-90
Sider (fra-til)1118-1123
Antal sider6
ISSN0026-2714
DOI
StatusUdgivet - sep. 2018
Begivenhed29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - AKKC, Aalborg, Danmark
Varighed: 1 okt. 20185 okt. 2018
Konferencens nummer: 29th
http://www.esref2018conf.org/

Konference

Konference29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
Nummer29th
LokationAKKC
Land/OmrådeDanmark
ByAalborg
Periode01/10/201805/10/2018
Internetadresse

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