Time Domain Analysis of Series-Resonant Converter in Auxiliary Power Supply for Medium-Voltage Converter

Zhixing Yan, Dipen Narendra Dalal, Shaokang Luan, Guihua Mao, Rui Wang, Bjorn Rannestad, Stig Munk-Nielsen, Hongbo Zhao

Publikation: Bidrag til bog/antologi/rapport/konference proceedingKonferenceartikel i proceedingForskningpeer review

7 Citationer (Scopus)

Abstract

The auxiliary power supply with high voltage isolation and low common-mode capacitance is one of the critical components inside medium-voltage power electronic converters. The isolation transformer design often ends up having a high leakage inductance as a consequence of the low isolation capacitance requirement imposed by the high switching voltage slew rate (dv/dt). In the case of series resonant converter this leakage inductance can be compensated by series-resonant capacitor. However, the winding resistance in the transformer still leads to increased voltage drop resulting power limitation. The objective of this paper is to deduce the time domain modelling of series-resonant converter considering isolation transformer winding resistor to analyze the trade-off between transformer winding resistance and voltage-drop.

OriginalsprogEngelsk
TitelAPEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition
Antal sider6
ForlagIEEE (Institute of Electrical and Electronics Engineers)
Publikationsdato2023
Sider2715-2720
ISBN (Elektronisk)9781665475396
DOI
StatusUdgivet - 2023
Begivenhed38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023 - Orlando, USA
Varighed: 19 mar. 202323 mar. 2023

Konference

Konference38th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2023
Land/OmrådeUSA
ByOrlando
Periode19/03/202323/03/2023
SponsorIEEE Industry Applications Society (IAS), IEEE Power Electronics Society (PELS), Power Sources Manufacturers Association (PSMA)
NavnI E E E Applied Power Electronics Conference and Exposition. Conference Proceedings
ISSN1048-2334

Bibliografisk note

Publisher Copyright:
© 2023 IEEE.

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