Projekter pr. år
Abstract
This paper quantifies the accuracy of thermal stress modeling in PV inverters under real mission profile operation. The estimated thermal stress profiles obtained from a lumped thermal network under one-day mission profiles are compared with the experimental measurement. According to the results, the average estimation error is well below 1.5 % even under highly dynamics mission profile conditions.
Originalsprog | Engelsk |
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Titel | Proceedings of 2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe) |
Antal sider | 8 |
Forlag | IEEE Press |
Publikationsdato | okt. 2020 |
Sider | 1-8 |
Artikelnummer | 9215595 |
ISBN (Trykt) | 978-1-7281-9807-1 |
ISBN (Elektronisk) | 978-9-0758-1536-8 |
DOI | |
Status | Udgivet - okt. 2020 |
Begivenhed | EPE'20 ECCE Europe: 22nd European Conference on Power Electronics and Applications - Lyon, Frankrig Varighed: 7 sep. 2020 → 11 sep. 2020 |
Konference
Konference | EPE'20 ECCE Europe: 22nd European Conference on Power Electronics and Applications |
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Land/Område | Frankrig |
By | Lyon |
Periode | 07/09/2020 → 11/09/2020 |
Fingeraftryk
Dyk ned i forskningsemnerne om 'Validation of Thermal Stress Modeling in PV Inverters under Mission Profile Operation'. Sammen danner de et unikt fingeraftryk.Projekter
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APETT: Advanced Power Electronic Technology and Tools
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Projekter: Projekt › Forskning