Validation of Thermal Stress Modeling in PV Inverters under Mission Profile Operation

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Abstract

This paper quantifies the accuracy of thermal stress modeling in PV inverters under real mission profile operation. The estimated thermal stress profiles obtained from a lumped thermal network under one-day mission profiles are compared with the experimental measurement. According to the results, the average estimation error is well below 1.5 % even under highly dynamics mission profile conditions.
OriginalsprogEngelsk
TitelProceedings of 2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)
Antal sider8
ForlagIEEE Press
Publikationsdatookt. 2020
Sider1-8
Artikelnummer9215595
ISBN (Trykt)978-1-7281-9807-1
ISBN (Elektronisk)978-9-0758-1536-8
DOI
StatusUdgivet - okt. 2020
BegivenhedEPE'20 ECCE Europe: 22nd European Conference on Power Electronics and Applications - Lyon, Frankrig
Varighed: 7 sep. 202011 sep. 2020

Konference

KonferenceEPE'20 ECCE Europe: 22nd European Conference on Power Electronics and Applications
Land/OmrådeFrankrig
ByLyon
Periode07/09/202011/09/2020

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