X-ray Diffraction Studies of Free-Standing Electrodeposited Cu-Patterns

K. Panthleon, Henrik Myhre Jensen, M. A. J. Somers

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review

Originalsprog	Engelsk
Tidsskrift	Advanced Engineering Materials
Vol/bind	6
Sider (fra-til)	828-832
ISSN	1438-1656
Status	Udgivet - 2004

AUB Link

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title = "X-ray Diffraction Studies of Free-Standing Electrodeposited Cu-Patterns",

keywords = "X-ray diffraction : Electrodeposition : Residual stress measurements : FEM modelling : Material mechanics.",

author = "K. Panthleon and Jensen, {Henrik Myhre} and Somers, {M. A. J.}",

year = "2004",

language = "English",

volume = "6",

pages = "828--832",

journal = "Advanced Engineering Materials",

issn = "1438-1656",

publisher = "Wiley",

}

TY - JOUR

T1 - X-ray Diffraction Studies of Free-Standing Electrodeposited Cu-Patterns

AU - Panthleon, K.

AU - Jensen, Henrik Myhre

AU - Somers, M. A. J.

PY - 2004

Y1 - 2004

KW - X-ray diffraction : Electrodeposition : Residual stress measurements : FEM modelling : Material mechanics.

M3 - Journal article

SN - 1438-1656

VL - 6

SP - 828

EP - 832

JO - Advanced Engineering Materials

JF - Advanced Engineering Materials

ER -