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20152021
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Research Output 2015 2019

  • 17 Article in proceeding
  • 8 Journal article
  • 2 Conference article in Journal
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Journal article
2019
51 Downloads (Pure)

A Fast-Switching Integrated Full-Bridge Power Module Based on GaN eHEMT Devices

Jørgensen, A. B., Beczkowski, S., Uhrenfeldt, C., Høgholt Petersen, N., Jørgensen, S. & Munk-Nielsen, S., Mar 2019, In : IEEE Transactions on Power Electronics. 34, 3, p. 2494-2504 11 p., 8375808.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
Gallium nitride
Packaging
SPICE
High electron mobility transistors
Semiconductor devices
8 Downloads (Pure)
Open Access
File
Silicon carbide
Natural frequencies
Electric potential
Electron tubes
Dielectric heating
31 Downloads (Pure)
Open Access
File
Capacitance
Electric potential
Energy dissipation
Power electronics
Packaging
2017
5 Citations (Scopus)
331 Downloads (Pure)

Modeling of Short-Circuit-Related Thermal Stress in Aged IGBT Modules

Bahman, A. S., Iannuzzo, F., Uhrenfeldt, C., Blaabjerg, F. & Munk-Nielsen, S., Sep 2017, In : I E E E Transactions on Industry Applications. 53, 5, p. 4788 - 4795 8 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
Insulated gate bipolar transistors (IGBT)
Thermal stress
Short circuit currents
Soldering alloys
Temperature distribution
15 Citations (Scopus)

Short-Circuit Degradation of 10-kV 10-A SiC MOSFET

Eni, E-P., Beczkowski, S., Munk-Nielsen, S., Kerekes, T., Teodorescu, R., Juluri, R. R., Julsgaard, B., VanBrunt, E., Hull, B., Sabri, S., Grider, D. & Uhrenfeldt, C., Dec 2017, In : I E E E Transactions on Power Electronics. 32, 12, p. 9342 - 9354 13 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Short circuit currents
Degradation
Aluminum
Melting point
Electron microscopes
2016
63 Citations (Scopus)
1396 Downloads (Pure)

Influences of Device and Circuit Mismatches on Paralleling Silicon Carbide MOSFETs

Li, H., Munk-Nielsen, S., Wang, X., Maheshwari, R. K., Beczkowski, S., Uhrenfeldt, C. & Franke, T., Jan 2016, In : I E E E Transactions on Power Electronics. 31, 1, p. 621 - 634 14 p.

Research output: Contribution to journalJournal articleResearchpeer-review

File
Silicon carbide
Networks (circuits)
Inductance
22 Citations (Scopus)

Power cycling test and failure analysis of molded Intelligent Power IGBT Module under different temperature swing durations

Choi, U., Blaabjerg, F., Jørgensen, S., Iannuzzo, F., Wang, H., Uhrenfeldt, C. & Munk-Nielsen, S., Sep 2016, In : Microelectronics Reliability. 64, p. 403-408 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

failure analysis
Insulated gate bipolar transistors (IGBT)
Failure analysis
cycles
modules
2015
10 Citations (Scopus)

Broadband photocurrent enhancement and light-trapping in thin film Si solar cells with periodic Al nanoparticle arrays on the front

Uhrenfeldt, C., Villesen, T. F., Tetu, A., Johansen, B. & Larsen, A. N., 1 Jun 2015, In : Optics Express. 23, 11, p. A525-A538 14 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
photocurrents
solar cells
trapping
broadband
nanoparticles