• Pontoppidanstræde 101, 3-014

    9220 Aalborg Ø

    Denmark

20132020
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  • 42 Similar Profiles
Temperature measurement Engineering & Materials Science
Insulated gate bipolar transistors (IGBT) Engineering & Materials Science
Temperature Engineering & Materials Science
Resistors Engineering & Materials Science
Silicon carbide Engineering & Materials Science
Semiconductor materials Engineering & Materials Science
Condition monitoring Engineering & Materials Science
Electric potential Engineering & Materials Science

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Projects 2018 2020

Research Output 2013 2020

24 Downloads (Pure)

Study of Current Density Influence on Bond Wire Degradation Rate in SiC MOSFET Modules

Luo, H., Iannuzzo, F., Baker, N., Blaabjerg, F., Li, W. & He, X., 2020, In : IEEE Journal of Emerging and Selected Topics in Power Electronics.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
Silicon carbide
Current density
Wire
Degradation
Aging of materials

Proof-of-concept for a kelvin-emitter on-chip temperature sensor for power semiconductors

Baker, N., Iannuzzo, F., Beczkowski, S. & Kristensen, P. K., Sep 2019, Proceedings of 2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe). IEEE Signal Processing Society, 8914963. (2019 21st European Conference on Power Electronics and Applications, EPE 2019 ECCE Europe).

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Temperature sensors
Resistors
Semiconductor materials
Insulated gate bipolar transistors (IGBT)
Temperature
3 Citations (Scopus)
98 Downloads (Pure)

The Temperature Dependence of the Flatband Voltage in High Power IGBTs

Baker, N. R. & Iannuzzo, F., Jul 2019, In : IEEE Transactions on Industrial Electronics. 66, 7, p. 5581 - 5584 4 p., 8411445.

Research output: Contribution to journalLetterResearchpeer-review

Open Access
File
Insulated gate bipolar transistors (IGBT)
Electric potential
Temperature
Temperature measurement
Power bipolar transistors

Failure protection in power modules with auxiliary-emitter bondwires

Baker, N. & Iannuzzo, F., Jan 2018, PCIM Europe 2018; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. VDE VERLAG, p. 1051-1056 6 p.

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Resistors
Explosions
Sensors

Impact of Kelvin-Source Resistors on Current Sharing and Failure Detection in Multichip Power Modules

Baker, N., Iannuzzo, F. & Li, H., Sep 2018, Proceedings of the 2018 20th European Conference on Power Electronics and Applications, EPE'18 ECCE Europe. IEEE Press, p. 1-7 7 p. 8515541

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Open Access
File
Resistors
Sensors
Electric current control
Silicon carbide
Semiconductor materials