• Pontoppidanstræde 101, 2-066

    9220 Aalborg Ø

    Denmark

19992023
If you made any changes in Pure these will be visible here soon.

Fingerprint The fingerprint consists of automatically generated concepts related to the associated persons. It is updated automatically, when new content is added.

  • 33 Similar Profiles
Insulated gate bipolar transistors (IGBT) Engineering & Materials Science
Short circuit currents Engineering & Materials Science
Electric potential Engineering & Materials Science
field effect transistors Physics & Astronomy
short circuits Physics & Astronomy
Temperature Engineering & Materials Science
Degradation Engineering & Materials Science
Wire Engineering & Materials Science

Network Dive into details by clicking on the dots.

Projects 2016 2023

Electronic equipment
Transfer functions
Industrial electronics
Monitoring
Analog to digital conversion
Power electronics
Hot Temperature

Online Monitor and lifetime prediction of IGBT modules

Iannuzzo, F. & Reigosa, P. D.

Schneider Electric

01/12/201731/01/2020

Project: Research

Insulated gate bipolar transistors (IGBT)
Condition monitoring
Power electronics
Industry

Research Output 1999 2020

Compact Sandwiched Press-Pack SiC Power Module with Low Stray Inductance and Balanced Thermal Stress

Chang, Y., Luo, H., Iannuzzo, F., Bahman, A. S., Li, W., He, X. & Blaabjerg, F., Mar 2020, In : IEEE Transactions on Power Electronics . 35, 3, p. 2237 - 2241 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Thermal stress
Inductance
Busbars
Heat resistance
Cooling
7 Downloads (Pure)

Impact of Repetitive Short-Circuit Tests on the Normal Operation of SiC MOSFETs Considering Case Temperature Influence

Du, H., Reigosa, P. D., Ceccarelli, L. & Iannuzzo, F., 2020, In : IEEE Journal of Emerging and Selected Topics in Power Electronics. 11 p.

Research output: Contribution to journalJournal articleResearchpeer-review

File
Silicon carbide
Short circuit currents
Temperature
Degradation
Leakage currents
23 Downloads (Pure)

Impact of Solder Degradation on VCE of IGBT Module: Experiments and Modeling

Jia, Y., Huang, Y., Xiao, F., Deng, H., Duan, Y. & Iannuzzo, F., 2020, In : IEEE Journal of Emerging and Selected Topics in Power Electronics.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
Insulated gate bipolar transistors (IGBT)
Soldering alloys
Degradation
Experiments
Heat resistance
16 Downloads (Pure)

Role of Threshold Voltage Shift in Highly Accelerated Power Cycling Tests for SiC MOSFET Modules

Luo, H., Iannuzzo, F. & Turnaturi, M., 2020, In : IEEE Journal of Emerging and Selected Topics in Power Electronics.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
Threshold voltage
Silicon carbide
Degradation
Carbide dies
Wire
24 Downloads (Pure)

Study of Current Density Influence on Bond Wire Degradation Rate in SiC MOSFET Modules

Luo, H., Iannuzzo, F., Baker, N., Blaabjerg, F., Li, W. & He, X., 2020, In : IEEE Journal of Emerging and Selected Topics in Power Electronics.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
Silicon carbide
Current density
Wire
Degradation
Aging of materials

Press / Media

International konference sætter fokus på bæredygtig energi

Francesco Iannuzzo

03/10/2018

2 items of Media coverage

Press/Media: Press / Media

Danmark på pålidelighedslandkortet i 2018

Frede Blaabjerg & Francesco Iannuzzo

04/05/2018

1 item of Media coverage

Press/Media: Press / Media