Projects per year
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- 33 Similar Profiles
Insulated gate bipolar transistors (IGBT)
Engineering & Materials Science
Short circuit currents
Engineering & Materials Science
Electric potential
Engineering & Materials Science
field effect transistors
Physics & Astronomy
short circuits
Physics & Astronomy
Temperature
Engineering & Materials Science
Degradation
Engineering & Materials Science
Wire
Engineering & Materials Science
Network
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Projects 2016 2023
ELMAC: Electronics Manufactured for Climate
Iannuzzo, F., Blaabjerg, F., Wang, H. & Török, L.
Department of Energy Technology
01/06/2019 → 31/05/2023
Project: Research
Electronic equipment
Transfer functions
Industrial electronics
Monitoring
Analog to digital conversion
X-POWER – Power Electronics Reliability Test Facilities
Blaabjerg, F., Iannuzzo, F., Wang, H., Bahman, A. S., Steffensen, B. & Ravn, T. K.
Danish Agency for Science and Higher Education
01/01/2019 → 31/12/2023
Project: Research
Test facilities
Power electronics
Industry
Life cycle
Lead
Inno-SE: Innovationsnetværket Smart Energy 2019-2020
Blaabjerg, F., Iannuzzo, F., Kær, S. K. & Wang, H.
01/12/2018 → 31/12/2020
Project: Research
Electrical and Thermal Characterization of Electronic Power Modules
01/06/2018 → 31/05/2020
Project: Research
Power electronics
Hot Temperature
Online Monitor and lifetime prediction of IGBT modules
Iannuzzo, F. & Reigosa, P. D.
01/12/2017 → 31/01/2020
Project: Research
Insulated gate bipolar transistors (IGBT)
Condition monitoring
Power electronics
Industry
Research Output 1999 2020
Compact Sandwiched Press-Pack SiC Power Module with Low Stray Inductance and Balanced Thermal Stress
Chang, Y., Luo, H., Iannuzzo, F., Bahman, A. S., Li, W., He, X. & Blaabjerg, F., Mar 2020, In : IEEE Transactions on Power Electronics . 35, 3, p. 2237 - 2241 5 p.Research output: Contribution to journal › Journal article › Research › peer-review
Thermal stress
Inductance
Busbars
Heat resistance
Cooling
Impact of Repetitive Short-Circuit Tests on the Normal Operation of SiC MOSFETs Considering Case Temperature Influence
Du, H., Reigosa, P. D., Ceccarelli, L. & Iannuzzo, F., 2020, In : IEEE Journal of Emerging and Selected Topics in Power Electronics. 11 p.Research output: Contribution to journal › Journal article › Research › peer-review
File
Silicon carbide
Short circuit currents
Temperature
Degradation
Leakage currents
Impact of Solder Degradation on VCE of IGBT Module: Experiments and Modeling
Jia, Y., Huang, Y., Xiao, F., Deng, H., Duan, Y. & Iannuzzo, F., 2020, In : IEEE Journal of Emerging and Selected Topics in Power Electronics.Research output: Contribution to journal › Journal article › Research › peer-review
Open Access
File
Insulated gate bipolar transistors (IGBT)
Soldering alloys
Degradation
Experiments
Heat resistance
Role of Threshold Voltage Shift in Highly Accelerated Power Cycling Tests for SiC MOSFET Modules
Luo, H., Iannuzzo, F. & Turnaturi, M., 2020, In : IEEE Journal of Emerging and Selected Topics in Power Electronics.Research output: Contribution to journal › Journal article › Research › peer-review
Open Access
File
Threshold voltage
Silicon carbide
Degradation
Carbide dies
Wire
Study of Current Density Influence on Bond Wire Degradation Rate in SiC MOSFET Modules
Luo, H., Iannuzzo, F., Baker, N., Blaabjerg, F., Li, W. & He, X., 2020, In : IEEE Journal of Emerging and Selected Topics in Power Electronics.Research output: Contribution to journal › Journal article › Research › peer-review
Open Access
File
Silicon carbide
Current density
Wire
Degradation
Aging of materials
Press / Media
International konference sætter fokus på bæredygtig energi
03/10/2018
2 items of Media coverage
Press/Media: Press / Media
Danmark på pålidelighedslandkortet i 2018
Frede Blaabjerg & Francesco Iannuzzo
04/05/2018
1 item of Media coverage
Press/Media: Press / Media