Projects per year
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Modeling and Design of Accelerated Reliability Testing for Power Semiconductors
Yu, X., Zhou, D. & Iannuzzo, F.
01/06/2021 → 31/05/2024
Project: PhD Project
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Failure Mechanism Analysis and Reliability Improvement for Cascode GaN Devices
01/02/2021 → 31/01/2024
Project: PhD Project
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Multi-Time Scale Modelling of Power Electronic Converters in Power System Applications
Fogsgaard, M. B., Blaabjerg, F., Iannuzzo, F. & Bahman, A. S.
01/09/2019 → 31/08/2022
Project: PhD Project
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ELMAC: Electronics Manufactured for Climate
Iannuzzo, F., Blaabjerg, F., Wang, H., Bahman, A. S. & Török, L.
Department of Energy Technology
01/06/2019 → 31/05/2023
Project: Research
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X-POWER – Power Electronics Reliability Test Facilities
Blaabjerg, F., Iannuzzo, F., Wang, H., Bahman, A. S., Steffensen, B. & Ravn, T. K.
Uddannelses- og forskningsministeriet
01/01/2019 → 31/12/2023
Project: Research
Research output
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Design for Reliability of SiC-MOSFET-Based 1500-V PV Inverters With Variable Gate Resistance
He, J., Sangwongwanich, A., Yang, Y., Zhang, K. & Iannuzzo, F., 14 Jun 2022, In: I E E E Transactions on Industry Applications. p. 1-11 11 p.Research output: Contribution to journal › Journal article › Research › peer-review
Open AccessFile3 Downloads (Pure) -
Intelligent DC- and AC Power-Cycling Platform for Power Electronic Components
Zhang, K., Fogsgaard, M. B. & Iannuzzo, F., 19 May 2022, p. 307-311. 5 p.Research output: Contribution to conference without publisher/journal › Conference abstract for conference › Research › peer-review
Open AccessFile64 Downloads (Pure) -
Intrusiveness of Power Device Condition Monitoring Methods: Introducing Figures of Merit for Condition Monitoring
Rizzo, S. A., Susinni, G. & Iannuzzo, F., 1 Mar 2022, In: IEEE Industrial Electronics Magazine. 16, 1, p. 60-69 10 p.Research output: Contribution to journal › Journal article › Research › peer-review
3 Citations (Scopus) -
Measuring Temperature Swing with Optical Fibers during Power Cycling of Power Components
Zhang, K. & Iannuzzo, F., 2022, (E-pub ahead of print).Research output: Contribution to conference without publisher/journal › Conference abstract for conference › Research › peer-review
Open AccessFile8 Downloads (Pure) -
On-line Junction Temperature and Current Synchronous Extraction for SiC MOSFETs With Electroluminescence Effect
Luo, H., Mao, J., Li, C., Iannuzzo, F., Li, W. GAE. & He, X., Jan 2022, In: IEEE Transactions on Power Electronics . 37, 1, p. 21-25 5 p.Research output: Contribution to journal › Journal article › Research › peer-review
1 Citation (Scopus)
Prizes
Press / Media
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Nyt testcenter med fokus på effektelektronik
Francesco Iannuzzo & Frede Blaabjerg
04/09/2020
2 items of Media coverage
Press/Media: Press / Media
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Universitet hjalp Kinas flådeekspert
Francesco Iannuzzo & Mogens Rysholt Poulsen
27/07/2020
3 items of Media coverage
Press/Media: Press / Media
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En stjerneforsker fra den kinesiske flåde så potentiale i dansk forskning
Francesco Iannuzzo & Mogens Rysholt Poulsen
27/07/2020
2 items of Media coverage
Press/Media: Press / Media
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Nye små halvledere bliver hurtigere slidt op af varme og stress
03/07/2020
1 item of Media coverage
Press/Media: Press / Media
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Nyt testcenter på Aalborg Universitet skal forbedre fremtidens elektronik
16/06/2020 → 22/06/2020
3 items of Media coverage
Press/Media: Press / Media