Projects per year
Fingerprint The fingerprint consists of automatically generated concepts related to the associated persons. It is updated automatically, when new content is added.
- 21 Similar Profiles
Insulated gate bipolar transistors (IGBT)
Engineering & Materials Science
Short circuit currents
Engineering & Materials Science
Electric potential
Engineering & Materials Science
field effect transistors
Physics & Astronomy
Temperature
Engineering & Materials Science
short circuits
Physics & Astronomy
Networks (circuits)
Engineering & Materials Science
heavy ions
Physics & Astronomy
Network
Dive into details by clicking on the dots.
Projects 2016 2023
- 8 Active
ELMAC: Electronics Manufactured for Climate
Iannuzzo, F., Blaabjerg, F., Wang, H. & Török, L.
Department of Energy Technology
01/06/2019 → 31/05/2023
Project: Research
Electronic equipment
Transfer functions
Industrial electronics
Monitoring
Analog to digital conversion
X-POWER – Power Electronics Reliability Test Facilities
Blaabjerg, F., Iannuzzo, F., Wang, H., Bahman, A. S., Steffensen, B. & Ravn, T. K.
Danish Agency for Science and Higher Education
01/01/2019 → 31/12/2023
Project: Research
Test facilities
Power electronics
Industry
Life cycle
Lead
Inno-SE: Innovationsnetværket Smart Energy 2019-2020
Blaabjerg, F., Iannuzzo, F., Kær, S. K. & Wang, H.
01/12/2018 → 31/12/2020
Project: Research
Electrical and Thermal Characterization of Electronic Power Modules
01/06/2018 → 31/05/2020
Project: Research
Power electronics
Hot Temperature
Online Monitor and lifetime prediction of IGBT modules
Iannuzzo, F. & Reigosa, P. D.
01/12/2017 → 31/01/2020
Project: Research
Insulated gate bipolar transistors (IGBT)
Condition monitoring
Power electronics
Industry
Research Output 1999 2019
A 3D thermal network model for monitoring imbalanced thermal distribution of press-pack IGBT modules in MMC-HVDC applications
Chang, Y., Li, W., Luo, H., He, X., Iannuzzo, F., Blaabjerg, F. & Lin, W., Apr 2019, In : Energies. 12, 7, 20 p., 1319.Research output: Contribution to journal › Journal article › Research › peer-review
Open Access
File
Thermal Model
Insulated gate bipolar transistors (IGBT)
Converter
Network Model
Voltage
1
Citation
(Scopus)
63
Downloads
(Pure)
A Lumped-Charge Approach Based Physical SPICE-Model for High Power Soft-Punch Through IGBT
Duan, Y., Xiao, F., Luo, Y. & Iannuzzo, F., Mar 2019, In : IEEE Journal of Emerging and Selected Topics in Power Electronics. 7, 1, p. 62-70 9 p., 8482289.Research output: Contribution to journal › Journal article › Research › peer-review
Open Access
File
Insulated gate bipolar transistors (IGBT)
SPICE
Temperature
Physics
Experiments
Comparative study of wire bond degradation under power and mechanical accelerated tests
Popok, V., Buhrkal-Donau, S., Czerny, B., Khatibi, G., Luo, H., Iannuzzo, F. & Pedersen, K., 22 Aug 2019, In : Journal of Materials Science: Materials in Electronics. 30, p. 17040-17045 6 p.Research output: Contribution to journal › Journal article › Research › peer-review
wire
Wire
degradation
Degradation
cycles
Impact of Solder Degradation on VCE of IGBT Module: Experiments and Modeling
Jia, Y., Huang, Y., Xiao, F., Deng, H., Duan, Y. & Iannuzzo, F., Dec 2019, In : IEEE Journal of Emerging and Selected Topics in Power Electronics.Research output: Contribution to journal › Journal article › Research › peer-review
Open Access
File
Insulated gate bipolar transistors (IGBT)
Soldering alloys
Degradation
Experiments
Heat resistance
Impact of the Case Temperature on the Reliability of SiC MOSFETs Under Repetitive Short Circuit Tests
Du, H., Reigosa, P. D., Iannuzzo, F. & Ceccarelli, L., Mar 2019, Proceedings of 2019 IEEE Annual Applied Power Electronics Conference and Exposition (APEC 2019). IEEE Press, p. 332-337 6 p.Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review
Open Access
File
Short circuit currents
Temperature
Bias voltage
Leakage currents
Wire
Press / Media
International konference sætter fokus på bæredygtig energi
03/10/2018
2 items of Media coverage
Press/Media: Press / Media
Danmark på pålidelighedslandkortet i 2018
Frede Blaabjerg & Francesco Iannuzzo
04/05/2018
1 item of Media coverage
Press/Media: Press / Media