• Pontoppidanstræde 101, 2-066

    9220 Aalborg Ø

    Denmark

19992023
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  • 21 Similar Profiles
Insulated gate bipolar transistors (IGBT) Engineering & Materials Science
Short circuit currents Engineering & Materials Science
Electric potential Engineering & Materials Science
field effect transistors Physics & Astronomy
Temperature Engineering & Materials Science
short circuits Physics & Astronomy
Networks (circuits) Engineering & Materials Science
heavy ions Physics & Astronomy

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Projects 2016 2023

Electronic equipment
Transfer functions
Industrial electronics
Monitoring
Analog to digital conversion
Power electronics
Hot Temperature

Online Monitor and lifetime prediction of IGBT modules

Iannuzzo, F. & Reigosa, P. D.

Schneider Electric

01/12/201731/01/2020

Project: Research

Insulated gate bipolar transistors (IGBT)
Condition monitoring
Power electronics
Industry

Research Output 1999 2019

3 Downloads (Pure)

A 3D thermal network model for monitoring imbalanced thermal distribution of press-pack IGBT modules in MMC-HVDC applications

Chang, Y., Li, W., Luo, H., He, X., Iannuzzo, F., Blaabjerg, F. & Lin, W., Apr 2019, In : Energies. 12, 7, 20 p., 1319.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
Thermal Model
Insulated gate bipolar transistors (IGBT)
Converter
Network Model
Voltage
1 Citation (Scopus)
63 Downloads (Pure)

A Lumped-Charge Approach Based Physical SPICE-Model for High Power Soft-Punch Through IGBT

Duan, Y., Xiao, F., Luo, Y. & Iannuzzo, F., Mar 2019, In : IEEE Journal of Emerging and Selected Topics in Power Electronics. 7, 1, p. 62-70 9 p., 8482289.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
Insulated gate bipolar transistors (IGBT)
SPICE
Temperature
Physics
Experiments

Comparative study of wire bond degradation under power and mechanical accelerated tests

Popok, V., Buhrkal-Donau, S., Czerny, B., Khatibi, G., Luo, H., Iannuzzo, F. & Pedersen, K., 22 Aug 2019, In : Journal of Materials Science: Materials in Electronics. 30, p. 17040-17045 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

wire
Wire
degradation
Degradation
cycles
8 Downloads (Pure)

Impact of Solder Degradation on VCE of IGBT Module: Experiments and Modeling

Jia, Y., Huang, Y., Xiao, F., Deng, H., Duan, Y. & Iannuzzo, F., Dec 2019, In : IEEE Journal of Emerging and Selected Topics in Power Electronics.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
Insulated gate bipolar transistors (IGBT)
Soldering alloys
Degradation
Experiments
Heat resistance
5 Downloads (Pure)

Impact of the Case Temperature on the Reliability of SiC MOSFETs Under Repetitive Short Circuit Tests

Du, H., Reigosa, P. D., Iannuzzo, F. & Ceccarelli, L., Mar 2019, Proceedings of 2019 IEEE Annual Applied Power Electronics Conference and Exposition (APEC 2019). IEEE Press, p. 332-337 6 p.

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Open Access
File
Short circuit currents
Temperature
Bias voltage
Leakage currents
Wire

Press / Media

International konference sætter fokus på bæredygtig energi

Francesco Iannuzzo

03/10/2018

2 items of Media coverage

Press/Media: Press / Media

Danmark på pålidelighedslandkortet i 2018

Frede Blaabjerg & Francesco Iannuzzo

04/05/2018

1 item of Media coverage

Press/Media: Press / Media