Projects per year
Fingerprint
The fingerprint consists of automatically generated concepts related to the associated persons. It is updated automatically, when new content is added.
- 1 Similar Profiles
Collaborations from the last five years
Dive into details by clicking on the dots.
-
New Concepts for Multi-stressor Accelerated Testing of Power Electronic Components
Zhang, K., Blaabjerg, F. & Iannuzzo, F.
01/10/2023 → 30/11/2024
Project: PhD Project
-
ISLE: Impact of Short‐circuit Events on Lifetime Expectancy of SiC MOSFETs
Iannuzzo, F., Sangwongwanich, A. & Frøstrup, S.
ECPE Engineering Center for Power Electronics GmbH
15/05/2023 → 31/12/2024
Project: Research
-
ALL2GaN: Affordable smart GaN IC solutions as enabler of greener applications
Iannuzzo, F., Bahman, A. S., Novak, M., Sangwongwanich, A., Zhao, S. & Frøstrup, S.
Horizon - Chips Joint Undertaking
01/05/2023 → 30/04/2026
Project: Research
-
Modeling and Design of Accelerated Reliability Testing for Power Semiconductors
Yu, X., Zhou, D. & Iannuzzo, F.
01/06/2021 → 31/05/2024
Project: PhD Project
-
Failure Mechanism Analysis and Reliability Improvement for Cascode GaN Devices
01/02/2021 → 31/01/2024
Project: PhD Project
Research output
-
Comparison of Junction Temperature Measurement Using the TSEP Method and Optical Fiber Method in IGBT Power Modules without Silicone Gel Removal
Zhang, K., Leduc, C. & Iannuzzo, F., 2023, PCIM Europe 2023; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management.Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review
Open AccessFile109 Downloads (Pure) -
Ferrite Beads Design to Improve Turn-off Characteristics of Cascode GaN HEMTs: An Optimum Design Method.
Xue, P. & Iannuzzo, F., 1 Jun 2023, In: IEEE Journal of Emerging and Selected Topics in Power Electronics. 11, 3, p. 3184-3194 11 p., 10097721.Research output: Contribution to journal › Journal article › Research › peer-review
Open AccessFile157 Downloads (Pure) -
Investigating the solder mask defects impact on leakage current on PCB under condensing humidity conditions
Zhang, K., Bahman, A. S., Iannuzzo, F., Chopade, A. R., Holst, J., Rao, J. M., Bahrebar, S. & Ambat, R., 2023, (E-pub ahead of print) In: Microelectronics Reliability.Research output: Contribution to journal › Journal article › Research › peer-review
Open AccessFile29 Downloads (Pure) -
Lifetime analysis of two commercial PV converters using multi-year degradation modelling
Fogsgaard, M. B., Zhang, Y., Bahman, A. S., Iannuzzo, F. & Blaabjerg, F., Sept 2023, In: e-Prime - Advances in Electrical Engineering, Electronics and Energy. 5, 100205.Research output: Contribution to journal › Journal article › Research › peer-review
Open AccessFile1 Citation (Scopus)4 Downloads (Pure) -
Low Inductive Characterization of Fast-Switching SiC MOSFETs and Active Gate Driver Units
Philipps, D. A., Xue, P., Ubostad, T. N., Iannuzzo, F. & Peftitsis, D., 1 Sept 2023, In: I E E E Transactions on Industry Applications. 59, 5, p. 6384-6398 15 p.Research output: Contribution to journal › Journal article › Research › peer-review
Prizes
Press/Media
-
Debat: Flydende forbindelser gør elektronik mere pålidelig
24/04/2023
1 Media contribution
Press/Media: Press / Media
-
Nyt testcenter med fokus på effektelektronik
Francesco Iannuzzo & Frede Blaabjerg
04/09/2020
2 items of Media coverage
Press/Media: Press / Media
-
En stjerneforsker fra den kinesiske flåde så potentiale i dansk forskning
Francesco Iannuzzo & Mogens Rysholt Poulsen
27/07/2020
2 items of Media coverage
Press/Media: Press / Media
-
Universitet hjalp Kinas flådeekspert
Francesco Iannuzzo & Mogens Rysholt Poulsen
27/07/2020
3 items of Media coverage
Press/Media: Press / Media
-
Nye små halvledere bliver hurtigere slidt op af varme og stress
03/07/2020
1 item of Media coverage
Press/Media: Press / Media