Photo of He Du
  • Pontoppidanstræde 101, 2-053

    9220 Aalborg Ø

    Denmark

20182019
If you made any changes in Pure these will be visible here soon.

Fingerprint The fingerprint consists of automatically generated concepts related to the associated persons. It is updated automatically, when new content is added.

  • 4 Similar Profiles
Short circuit currents Engineering & Materials Science
short circuits Physics & Astronomy
field effect transistors Physics & Astronomy
degradation Physics & Astronomy
Degradation Engineering & Materials Science
static characteristics Physics & Astronomy
cycles Physics & Astronomy
Leakage currents Engineering & Materials Science

Research Output 2018 2019

  • 2 Conference article in Journal
  • 1 Article in proceeding
5 Downloads (Pure)

Impact of the Case Temperature on the Reliability of SiC MOSFETs Under Repetitive Short Circuit Tests

Du, H., Reigosa, P. D., Iannuzzo, F. & Ceccarelli, L., Mar 2019, Proceedings of 2019 IEEE Annual Applied Power Electronics Conference and Exposition (APEC 2019). IEEE Press, p. 332-337 6 p.

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Open Access
File
Short circuit currents
Temperature
Bias voltage
Leakage currents
Wire

Implications of short-circuit events on power cycling of 1.2-kV/20-A SiC MOSFET power modules

Du, H., Ceccarelli, L., Iannuzzo, F. & Reigosa, P. D., 2019, (Accepted/In press) In : Microelectronics Reliability.

Research output: Contribution to journalConference article in JournalResearchpeer-review

Open Access
File
short circuits
Short circuit currents
field effect transistors
cycles
degradation
1 Citation (Scopus)
20 Downloads (Pure)

Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules

Du, H., Reigosa, P. D., Iannuzzo, F. & Ceccarelli, L., 1 Sep 2018, In : Microelectronics Reliability. 88-90, p. 661-665 5 p.

Research output: Contribution to journalConference article in JournalResearchpeer-review

short circuits
Short circuit currents
field effect transistors
static characteristics
degradation