Photo of He Du
  • Pontoppidanstræde 101, 2-053

    9220 Aalborg Ø

    Denmark

20182020

Research output per year

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Research Output

  • 3 Journal article
  • 2 Article in proceeding
  • 1 Conference article in Journal
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Conference article in Journal
2018

Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules

Du, H., Reigosa, P. D., Iannuzzo, F. & Ceccarelli, L., 1 Sep 2018, In : Microelectronics Reliability. 88-90, p. 661-665 5 p.

Research output: Contribution to journalConference article in JournalResearchpeer-review

3 Citations (Scopus)
20 Downloads (Pure)