Projects per year
Fingerprint
The fingerprint consists of automatically generated concepts related to the associated persons. It is updated automatically, when new content is added.
- 1 Similar Profiles
Collaborations from the last five years
Dive into details by clicking on the dots.
Projects
- 1 Active
-
Physics-informed Data-driven Methods for Reliability Test and Analysis of Semiconductor Switches in Power Converters
01/11/2021 → 31/10/2024
Project: PhD Project
-
An Estimation Method of High-order LC Circuits in Power Electronic Converters
Bo, Y., Peng, Y., Zhang, Y., Wang, H. & Wang, H., 1 May 2024, In: I E E E Transactions on Industrial Electronics. 71, 5, p. 5274-5284 11 p., 10155667.Research output: Contribution to journal › Journal article › Research › peer-review
Open AccessFile1 Citation (Scopus)26 Downloads (Pure) -
Figures-of-Merit Study for Thermal Transient Measurement of SiC MOSFETs
Zhang, Y., Zhang, Y., Wong, V. H., Kalker, S., Caruso, A., Ruppert, L., Iannuzzo, F. & Doncker, R. W. D., 2024, In: IEEE Transactions on Power Electronics . 39, 9, p. 11583-11595 13 p., 10483537.Research output: Contribution to journal › Journal article › Research › peer-review
1 Citation (Scopus) -
gEOL: A Gradient-based End-of-Life Criterion for Power Semiconductor Modules
Zhang, Y., Zhang, Y. & Wang, H., 1 Mar 2024, In: IEEE Transactions on Power Electronics . 39, 3, p. 2927-2931 5 p.Research output: Contribution to journal › Journal article › Research › peer-review
Open AccessFile2 Citations (Scopus)13 Downloads (Pure) -
Guideline for Reproducible SiC MOSFET Thermal Characterization Based on Source-Drain Voltage
Zhang, Y., Zhang, Y., Xu, Z., Wang, Z., Wong, V. H., Lu, Z. & Caruso, A., 1 May 2024, In: IEEE Transactions on Industry Applications. 60, 3, p. 4229-4238 10 p., 10387730.Research output: Contribution to journal › Journal article › Research › peer-review
4 Citations (Scopus) -
Impact of Bond Wire Degradation on Thermal Estimation and Temperature Coefficient of IGBT Modules in Power Cycling Test
Zhang, Y., Zhang, Y., Yao, B. & Wang, H., 2024, 2024 IEEE Applied Power Electronics Conference and Exposition, APEC 2024. IEEE Signal Processing Society, p. 2443-2447 5 p. (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC).Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review
1 Citation (Scopus)2 Downloads (Pure)
Datasets
-
POWER CYCLING TEST DATASET (GEOL: A GRADIENT-BASED END-OF-LIFE CRITERION FOR POWER SEMICONDUCTOR MODULES)
Zhang, Y. (Contributor), Zhang, Y. (Creator) & Wang, H. (Contributor), IEEE DataPort, 1 Dec 2023
DOI: 10.21227/ksrt-zq09, https://ieee-dataport.org/documents/power-cycling-test-dataset-geol-gradient-based-end-life-criterion-power-semiconductor
Dataset
File