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Research profile
Yichi Zhang received the B.S. degree in electrical engineering from Shenyang Agricultural University (SYAU), Shenyang, China, in 2017, the M.S. degree in power electronics from Southwest Jiaotong University (SWJTU), Chengdu, China, in 2021, the Ph.D. degree in power electronic from Aalborg University (AAU), Aalborg, Denmark, 2024. From March to June 2024, he was a Visiting Researcher with the Institute for Power Electronics and Electrical Drives (ISEA) at RWTH Aachen, Aachen, Germany. He is currently a Postdoctoral Researcher with the Department of Energy, Aalborg University. His research interests include failure mechanism analysis, physics-informed and data-driven-based degradation modeling, thermal modeling, and condition monitoring of semiconductor switches in power electronics.
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Collaborations from the last five years
Projects
- 1 Finished
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Physics-informed Data-driven Methods for Reliability Test and Analysis of Semiconductor Switches in Power Converters
Zhang, Y. (PI) & Wang, H. (Supervisor)
01/11/2021 → 31/10/2024
Project: PhD Project
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Power Cycling Testing for Power Semiconductor Switches: Methods, Standards, Limitations, and Outlooks
Zhang, Y., Heimler, P., Abuogo, J. O., Zhang, X., Zhang, Y., Xie, D., Zhang, Y., Zhang, K., Li, X., Luo, H., Schmidt, R., Blaabjerg, F., Wang, H. & Basler, T., Jan 2026, In: IEEE Transactions on Power Electronics . 41, 1, p. 849-869 21 p.Research output: Contribution to journal › Journal article › Research › peer-review
Open Access5 Link opens in a new tab Citations (Scopus) -
A Current-Independent Junction Temperature Estimation Method for IGBTs Based on Initial Turn-on Voltage
Xu, Z., Ge, X., Wang, H., Liu, J., Zhang, Y., Xie, D., Li, K., Zhang, L. & Zhang, Y., Sept 2025, In: IEEE Transactions on Electron Devices. 72, 9, p. 5080-5088 9 p.Research output: Contribution to journal › Journal article › Research › peer-review
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Configuration Selection for Degradation Trajectory Prediction of Power Modules Based LSTM Model
Zhang, Y., Zhang, Y., Kong, J., Liu, J., Yao, B. & Wang, H., 2025, 2025 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia, WiPDA Asia 2025. IEEE (Institute of Electrical and Electronics Engineers)Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review
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Junction Temperature Monitoring of Power Devices Using Convolutional Neural Networks
Xu, Z., Wang, H., Ge, X., Zhang, Y., Xie, D., Yao, B., Zhang, L., Wang, Y. & Feng, X., 2025, In: IEEE Transactions on Industry Applications. 61, 4, p. 6632-6643 12 p.Research output: Contribution to journal › Journal article › Research › peer-review
1 Link opens in a new tab Citation (Scopus) -
Machine learning-based surrogate models for finned heatsink thermal modeling
Wang, Z., Zhang, Y. & Wang, H., Sept 2025, In: Microelectronics Reliability. 172, 115775.Research output: Contribution to journal › Journal article › Research › peer-review
Open AccessFile1 Downloads (Pure)
Datasets
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POWER CYCLING TEST DATASET (GEOL: A GRADIENT-BASED END-OF-LIFE CRITERION FOR POWER SEMICONDUCTOR MODULES)
Zhang, Y. (Contributor), Zhang, Y. (Creator) & Wang, H. (Contributor), IEEE DataPort, 1 Dec 2023
DOI: 10.21227/ksrt-zq09, https://ieee-dataport.org/documents/power-cycling-test-dataset-geol-gradient-based-end-life-criterion-power-semiconductor
Dataset
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