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Research profile
Yichi Zhang received the B.S. degree in electrical engineering from Shenyang Agricultural University (SYAU), Shenyang, China, in 2017, the M.S. degree in power electronics from Southwest Jiaotong University (SWJTU), Chengdu, China, in 2021, the Ph.D. degree in power electronic from Aalborg University (AAU), Aalborg, Denmark, 2024. From March to June 2024, he was a Visiting Researcher with the Institute for Power Electronics and Electrical Drives (ISEA) at RWTH Aachen, Aachen, Germany. He is currently a Postdoctoral Researcher with the Department of Energy, Aalborg University. His research interests include failure mechanism analysis, physics-informed and data-driven-based degradation modeling, thermal modeling, and condition monitoring of semiconductor switches in power electronics.
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Collaborations from the last five years
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Projects
- 1 Finished
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Physics-informed Data-driven Methods for Reliability Test and Analysis of Semiconductor Switches in Power Converters
Zhang, Y. (PI) & Wang, H. (Supervisor)
01/11/2021 → 31/10/2024
Project: PhD Project
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Power Cycling Testing for Power Semiconductor Switches: Methods, Standards, Limitations, and Outlooks
Zhang, Y., Heimler, P., Abuogo, J. O., Zhang, X., Zhang, Y., Xie, D., Zhang, Y., Zhang, K., Li, X., Luo, H., Schmidt, R., Blaabjerg, F., Wang, H. & Basler, T., Jan 2026, In: IEEE Transactions on Power Electronics . 41, 1, p. 849-869 21 p.Research output: Contribution to journal › Journal article › Research › peer-review
Open Access3 Citations (Scopus) -
Physics-informed Neural Network Approach for Early Degradation Trajectory Prediction of Power Semiconductor Modules
Kong, J., Zhang, Y., Zhang, Y., Wick, L. Y., Hansen, F. L., Zhou, D. & Wang, H., 1 May 2025, 2025 IEEE Applied Power Electronics Conference and Exposition (APEC). IEEE (Institute of Electrical and Electronics Engineers), p. 2380-2386 7 p.Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review
1 Citation (Scopus)106 Downloads (Pure) -
Accelerated Degradation Testing and Failure Mechanism Analysis of Metallized Film Capacitors for AC Filtering
Yao, B., Wei, X., Zhang, Y., Correia, P., Wu, R., Song, S., Trintis, I., Wang, H. & Wang, H., 1 May 2024, In: IEEE Transactions on Power Electronics . 39, 5, p. 6256-6270 15 p., 10416696.Research output: Contribution to journal › Journal article › Research › peer-review
24 Citations (Scopus) -
An Estimation Method of High-order LC Circuits in Power Electronic Converters
Bo, Y., Peng, Y., Zhang, Y., Wang, H. & Wang, H., 1 May 2024, In: I E E E Transactions on Industrial Electronics. 71, 5, p. 5274-5284 11 p., 10155667.Research output: Contribution to journal › Journal article › Research › peer-review
Open AccessFile8 Citations (Scopus)119 Downloads (Pure) -
An Online Gate Oxide Degradation Monitoring Method for SiC Mosfets Based on Turn-On Gate Voltage Filtering
Liu, J., Yao, B., Wei, X., Zhang, Y. & Wang, H., 1 May 2024, In: IEEE Transactions on Power Electronics . 39, 5, p. 5020-5026 7 p., 10423833.Research output: Contribution to journal › Journal article › Research › peer-review
13 Citations (Scopus)
Datasets
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POWER CYCLING TEST DATASET (GEOL: A GRADIENT-BASED END-OF-LIFE CRITERION FOR POWER SEMICONDUCTOR MODULES)
Zhang, Y. (Contributor), Zhang, Y. (Creator) & Wang, H. (Contributor), IEEE DataPort, 1 Dec 2023
DOI: 10.21227/ksrt-zq09, https://ieee-dataport.org/documents/power-cycling-test-dataset-geol-gradient-based-end-life-criterion-power-semiconductor
Dataset
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