Billeddannelse i anden-harmonisk nærfeltsmikroskopi / Image Formation in Second-Harmonic Near-Field Microscopy

A macroscopic self-consistent approach that allows one to rigorously describe image formation in second-harmonic scanning near-field optical microscopy has been developed. The self-consistent problem for both fundamental and second-harmonic frequencies has been solved exactly with a new approach to the determination of the Green dyadic of the system. Image formation in the illumination second-harmonic near-field microscopy has been considered within the framework of the approach developed. Near-field optical and images at fundamental and second-harmonic frequencies have been calculated for different polarization configurations and parameters of a rectangular object with nonlinear susceptibility. (Sergey I. Bozhevolnyi; Valery Z. Lozovski, Institute of Semiconductor Physics, Ukraine)