Center Of Reliable Power Electronics (CORPE)

Blaabjerg, Frede (PI)
Munk-Nielsen, Stig (Project Participant)
Pedersen, Kjeld (Project Participant)
Popok, Vladimir (Project Participant)

AAU Energy

104 Article in proceeding
74 Journal article
13 Conference article in Journal
6 Book chapter
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13 results

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2018
Effect of short-circuit stress on the degradation of the SiO₂ dielectric in SiC power MOSFETs
Reigosa, P. D., Iannuzzo, F. & Ceccarelli, L., Sept 2018, In: Microelectronics Reliability. 88-90, p. 577-583 7 p.
Research output: Contribution to journal › Conference article in Journal › Research › peer-review

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55 Citations (Scopus)

615 Downloads (Pure)
Failure mechanism analysis of fuses subjected to manufacturing and operational thermal stresses
Bahman, A. S., Jensen, S. M. & Iannuzzo, F., Sept 2018, In: Microelectronics Reliability. 88-90, p. 304-308 5 p.
Research output: Contribution to journal › Conference article in Journal › Research › peer-review

Open Access
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4 Citations (Scopus)

686 Downloads (Pure)
Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter
Ceccarelli, L., Luo, H. & Iannuzzo, F., Sept 2018, In: Microelectronics Reliability. 88-90, p. 627-630 4 p.
Research output: Contribution to journal › Conference article in Journal › Research › peer-review

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20 Citations (Scopus)

1602 Downloads (Pure)
Investigation of acoustic emission as a non-invasive method for detection of power semiconductor aging
Davari, P., Kristensen, O. D. & Iannuzzo, F., Sept 2018, In: Microelectronics Reliability. 88-90, p. 545-549 5 p.
Research output: Contribution to journal › Conference article in Journal › Research › peer-review

Open Access
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41 Citations (Scopus)

371 Downloads (Pure)
Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules
Du, H., Reigosa, P. D., Iannuzzo, F. & Ceccarelli, L., 1 Sept 2018, In: Microelectronics Reliability. 88-90, p. 661-665 5 p.
Research output: Contribution to journal › Conference article in Journal › Research › peer-review

Open Access
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14 Citations (Scopus)

360 Downloads (Pure)
On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition
Luo, H., Reigosa, P. D., Iannuzzo, F. & Blaabjerg, F., Sept 2018, In: Microelectronics Reliability. 88-90, p. 563-567 5 p.
Research output: Contribution to journal › Conference article in Journal › Research › peer-review

Open Access
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13 Citations (Scopus)

319 Downloads (Pure)
Power cycling test of transfer molded IGBT modules by advanced power cycler under different junction temperature swings
Choi, U. M., Jørgensen, S., Iannuzzo, F. & Blaabjerg, F., Sept 2018, In: Microelectronics Reliability. 88-90, p. 788-794 7 p.
Research output: Contribution to journal › Conference article in Journal › Research › peer-review

Open Access
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12 Citations (Scopus)

433 Downloads (Pure)
Simple and effective open switch fault diagnosis of single-phase PWM rectifier
Hu, K., Liu, Z., Iannuzzo, F. & Blaabjerg, F., Sept 2018, In: Microelectronics Reliability. 88-90, p. 423-427 5 p.
Research output: Contribution to journal › Conference article in Journal › Research › peer-review

Open Access
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10 Citations (Scopus)

243 Downloads (Pure)
Smart SiC MOSFET accelerated lifetime testing
Baker, N. & Iannuzzo, F., Sept 2018, In: Microelectronics Reliability. 88-90, p. 43-47 5 p.
Research output: Contribution to journal › Conference article in Journal › Research › peer-review

Open Access
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8 Citations (Scopus)

409 Downloads (Pure)
Thermal modeling of wire-bonded power modules considering non-uniform temperature and electric current interactions
Akbari, M., Bahman, A. S., Reigosa, P. D., Iannuzzo, F. & Tavakoli Bina, M., Sept 2018, In: Microelectronics Reliability. 88-90, p. 1135-1140 6 p.
Research output: Contribution to journal › Conference article in Journal › Research › peer-review

Open Access
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18 Citations (Scopus)

321 Downloads (Pure)
2017
A survey of SiC power MOSFETs short-circuit robustness and failure mode analysis
Ceccarelli, L., Reigosa, P. D., Iannuzzo, F. & Blaabjerg, F., Sept 2017, In: Microelectronics Reliability. 76-77, p. 272-276 5 p.
Research output: Contribution to journal › Conference article in Journal › Research › peer-review

Open Access
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97 Citations (Scopus)

1319 Downloads (Pure)
2016
Mechanisms of metallization degradation in high power diodes
Brincker, M., Kristensen, P. K., Pedersen, K. B. & Popok, V., 18 Sept 2016, In: Microelectronics Reliability. 64, p. 489–493 5 p.
Research output: Contribution to journal › Conference article in Journal › Research › peer-review
6 Citations (Scopus)
2013
Design Optimization of Transformerless Grid-Connected PV Inverters Including Reliability
Koutroulis, E. & Blaabjerg, F., Jan 2013, In: I E E E Transactions on Power Electronics. 28, 1, p. 325-335 11 p.
Research output: Contribution to journal › Conference article in Journal › Research › peer-review

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193 Citations (Scopus)

768 Downloads (Pure)

Center Of Reliable Power Electronics (CORPE)

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