Enabling Fast Image Acquisition for Atomic Force Microscopy using Compressed Sensing

Larsen, Torben (Project Licensee)
Østergaard, Jan (Project Participant)
Jensen, Tobias (Project Participant)
Arildsen, Thomas (Project Participant)
Oxvig, Christian Schou (Project Participant)
Pedersen, Patrick Steffen (Project Participant)

Department of Electronic Systems

2 Conference presentations
1 Visiting another research institution

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Cambridge University
Thomas Arildsen (Visiting researcher)
20 Sep 2016 → 22 Sep 2016
Activity: Visiting another research institution