Enabling Fast Image Acquisition for Atomic Force Microscopy using Compressed Sensing

Larsen, Torben (Project Licensee)
Østergaard, Jan (Project Participant)
Jensen, Tobias (Project Participant)
Arildsen, Thomas (Project Participant)
Oxvig, Christian Schou (Project Participant)
Pedersen, Patrick Steffen (Project Participant)

Department of Electronic Systems

2 Conference presentations
1 Visiting another research institution

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University of Cambridge
Thomas Arildsen (Visiting researcher)
20 Sept 2016 → 22 Sept 2016
Activity: Visiting another research institution