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Author

  • Francesco Iannuzzo
2018

Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules

Du, H., Reigosa, P. D., Iannuzzo, F. & Ceccarelli, L., 1 Sep 2018, In : Microelectronics Reliability. 88-90, p. 661-665 5 p.

Research output: Contribution to journalConference article in JournalResearchpeer-review

3 Citations (Scopus)
20 Downloads (Pure)
2020

Lifetime Evaluation of Power Modules for Three-Level 1500-V PV Inverters Considering Mission Profiles

He, J., Sangwongwanich, A., Yang, Y. & Iannuzzo, F., Jun 2020, 35th Annual IEEE Applied Power Electronics Conference & Exposition (APEC 2020). IEEE Press, p. 430-435 6 p. (35th Annual IEEE Applied Power Electronics Conference & Exposition (APEC 2020)).

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

2018

Non-uniform Temperature Distribution Implications on Thermal Analysis Accuracy of Si IGBTs and SiC MOSFETs

Akbari, M., Bahman, A. S., Reigosa, P. D., Ceccarelli, L., Iannuzzo, F. & Tavakoli Bina, M., Sep 2018, Proceedings of the 2018 24rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC). IEEE Press, p. 1-6 6 p. (International Workshop on Thermal Investigations of ICs and Systems).

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Open Access
File
2 Citations (Scopus)
162 Downloads (Pure)
2016

A 3D Lumped Thermal Network Model for Long-term Load Profiles Analysis in High Power IGBT Modules

Bahman, A. S., Ma, K., Ghimire, P., Iannuzzo, F. & Blaabjerg, F., Sep 2016, In : I E E E Journal of Emerging and Selected Topics in Power Electronics. 4, 3, p. 1050 - 1063 14 p.

Research output: Contribution to journalJournal articleResearchpeer-review

File
67 Citations (Scopus)
1333 Downloads (Pure)
2015

Comprehensive Investigation on Current Imbalance among Parallel Chips inside MW-Scale IGBT Power Modules

Wu, R., Smirnova, L., Wang, H., Iannuzzo, F. & Blaabjerg, F., Jun 2015, Proceedings of the 2015 9th International Conference on Power Electronics and ECCE Asia (ICPE-ECCE Asia). IEEE Press, p. 850 - 856 7 p. 7167881

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

File
18 Citations (Scopus)
793 Downloads (Pure)
2014

Mechanoluminescence of nylon under high velocity impact

Bonora, N., Ruggiero, A., Iannitti, G., Abbate, C., Iannuzzo, F. & Busatto, G., 1 Jan 2014, In : Journal of Physics: Conference Series (Online). 500, PART 18, 182005.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
1 Citation (Scopus)
2013

Single-event effects in power mosfets during heavy ion irradiations performed after gamma-ray degradation

Busatto, G., De Luca, V., Iannuzzo, F., Sanseverino, A. & Velardi, F., 19 Sep 2013, In : IEEE Transactions on Nuclear Science. 60, 5, p. 3793-3801 9 p., 6596513.

Research output: Contribution to journalJournal articleResearchpeer-review

5 Citations (Scopus)
2012

A time-resolved IBICC experiment using the IEEM of the SIRAD facility

Silvestrin, L., Bisello, D., Busatto, G., Giubilato, P., Iannuzzo, F., Mattiazzo, S., Pantano, D., Sanseverino, A., Tessaro, M., Velardi, F. & Wyss, J., 15 Feb 2012, In : Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 273, p. 234-236 3 p.

Research output: Contribution to journalConference article in JournalResearchpeer-review

5 Citations (Scopus)
2015

Analysis of heavy ion irradiation induced thermal damage in SiC Schottky diodes

Abbate, C., Busatto, G., Cova, P., Delmonte, N., Giuliani, F., Iannuzzo, F., Sanseverino, A. & Velardi., F., Feb 2015, In : IEEE Transactions on Nuclear Science. 62, 1, p. 202-209 8 p.

Research output: Contribution to journalJournal articleResearchpeer-review

19 Citations (Scopus)
2016

Parameter Extraction for PSpice Models by means of an Automated Optimization Tool – An IGBT model Study Case

Suárez, C. G., Reigosa, P. D., Iannuzzo, F., Trintis, I. & Blaabjerg, F., May 2016, Proceedings of PCIM Europe 2016. International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. VDE Verlag GMBH, p. 831-838 8 p.

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

4 Citations (Scopus)

Ultra-Low Inductance Design for a GaN HEMT Based 3L-ANPC Inverter

Gurpinar, E., Castellazzi, A., Iannuzzo, F., Yang, Y. & Blaabjerg, F., Sep 2016, Proceedings of the 8th Annual IEEE Energy Conversion Congress and Exposition, ECCE 2016. IEEE Press, p. 1-8 8 p. EC-0548

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

4 Citations (Scopus)

Investigation on the Short Circuit Safe Operation Area of SiC MOSFET Power Modules

Reigosa, P. D., Luo, H., Iannuzzo, F. & Blaabjerg, F., Sep 2016, Proceedings of 8th IEEE Energy Conversion Congress and Exposition (ECCE), 2016. IEEE Press, 6 p.

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Open Access
File
10 Citations (Scopus)
297 Downloads (Pure)
2018

Simple and effective open switch fault diagnosis of single-phase PWM rectifier

Hu, K., Liu, Z., Iannuzzo, F. & Blaabjerg, F., Sep 2018, In : Microelectronics Reliability. 88-90, p. 423-427 5 p.

Research output: Contribution to journalConference article in JournalResearchpeer-review

9 Downloads (Pure)

A Multi-Layer RC Thermal Model for Power Modules Adaptable to Different Operating Conditions and Aging

Akbari, M., Bahman, A. S., Tavakoli Bina, M., Eskandari, B., Iannuzzo, F. & Blaabjerg, F., 30 Oct 2018, Proceedings of 2018 20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe). IEEE, p. 1-10 10 p. 8515416

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Open Access
File
1 Citation (Scopus)
40 Downloads (Pure)
2020

Separation of Bond-Wire and Solder Layer Failure Modes in IGBT Power Modules

Liu, W., Zhou, D., Hartmann, M., Iannuzzo, F. & Blaabjerg, F., 2020, (Accepted/In press) 2020, (Accepted/In press) 2020 IEEE Energy Conversion Congress and Exposition (ECCE).. p. 1-7 7 p.

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

2017

Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules

Luo, H., Baker, N., Iannuzzo, F. & Blaabjerg, F., Sep 2017, In : Microelectronics Reliability. 76-77, p. 415-419 5 p.

Research output: Contribution to journalConference article in JournalResearchpeer-review

11 Citations (Scopus)
2016

Loss Distribution Analysis of Three-Level Active Neutral-Point-Clamped (3L-ANPC) Converter with Different PWM Strategies

Zhang, G., Yang, Y., Iannuzzo, F., Li, K., Blaabjerg, F. & Xu, H., Dec 2016, Proceedings of the IEEE Southern Power Electronics Conference (SPEC), 2016. IEEE Press, 6 p.

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

7 Citations (Scopus)
2011

Operation of SiC normally-off JFET at the edges of its safe operating area

Abbate, C., Busatto, G. & Iannuzzo, F., 1 Sep 2011, In : Microelectronics Reliability. 51, 9-11, p. 1767-1772 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

12 Citations (Scopus)
2016

Short-Circuit Robustness Assessment in Power Electronic Modules for Megawatt Applications

Iannuzzo, F., Mar 2016, In : Electronics and Energetics. 29, 1, p. 35-47 9 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Reliability issues in power electronics

Iannuzzo, F. & Ciappa, M., 2016, In : Microelectronics Reliability. 58, p. 1-2 2 p.

Research output: Contribution to journalEditorialResearchpeer-review

1 Citation (Scopus)
2019

Implications of Ageing through Power Cycling on the Short Circuit Robustness of 1.2-kV SiC MOSFETs

Reigosa, P. D., Luo, H. & Iannuzzo, F., Nov 2019, In : IEEE Transactions on Power Electronics. 34, 11, p. 11182 - 11190 9 p., 8634945.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
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30 Downloads (Pure)
2014

The Impact of Gate-Driver Parameters Variation and Device Degradation in the PV-Inverter Lifetime

Sintamarean, N. C., Wang, H., Blaabjerg, F. & Iannuzzo, F., Sep 2014, Proceedings of the 2014 IEEE Energy Conversion Congress and Exposition (ECCE). IEEE Press, p. 2257-2264 8 p.

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

12 Citations (Scopus)
45 Downloads (Pure)
2012

Unclamped repetitive stress on 1200 v normally-off SiC JFETs

Abbate, C., Busatto, G. & Iannuzzo, F., 1 Sep 2012, In : Microelectronics Reliability. 52, 9-10, p. 2420-2425 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

6 Citations (Scopus)
2014

Turn-off instabilities in large area IGBTs

Abbate, C., Iannuzzo, F., Busatto, G., Sanseverino, A., Velardi, F., Ronsisvalle, C. & Victory, J., 1 Jan 2014, In : Microelectronics Reliability. 54, 9-10, p. 1927-1934 8 p.

Research output: Contribution to journalJournal articleResearchpeer-review

2019

Modeling of igbt with high bipolar gain for mitigating gate voltage oscillations during short circuit

Reigosa, P. D., Iannuzzo, F., Corvasce, C. & Rahimo, M., Sep 2019, In : IEEE Journal of Emerging and Selected Topics in Power Electronics. 7, 3, p. 1584 - 1592 9 p., 8698267.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
17 Downloads (Pure)
2018

Performance Analysis of a Single-phase GaN-based 3L-ANPC Inverter for Photovoltaic Applications

Valente, M., Iannuzzo, F., Yang, Y. & Gurpinar, E., Dec 2018, Proceedings of 2018 IEEE 4th Southern Power Electronics Conference (SPEC). IEEE Press, 8 p.

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Open Access
File
84 Downloads (Pure)
2019

Loss and Thermal Modeling of Metal Oxide Varistors (MOV) Under Standard Current Surge Mission Profile

Vernica, I., Jensen, P. T., Wang, H., Iannuzzo, F., Otto, S. & Blaabjerg, F., Sep 2019, 2019 IEEE Energy Conversion Congress and Exposition, ECCE 2019. USA: IEEE Press, p. 7113-7117 5 p. 8913287. (IEEE Energy Conversion Congress and Exposition).

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Open Access
File
41 Downloads (Pure)
2018

Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter

Ceccarelli, L., Luo, H. & Iannuzzo, F., Sep 2018, In : Microelectronics Reliability. 88-90, p. 627-630 4 p.

Research output: Contribution to journalConference article in JournalResearchpeer-review

1 Citation (Scopus)
14 Downloads (Pure)
2019

Impact of device aging in the compact electro-thermal modeling of SiC power MOSFETs

Ceccarelli, L., Bahman, A. S. & Iannuzzo, F., Sep 2019, In : Microelectronics Reliability. 100-101, 113336.

Research output: Contribution to journalJournal articleResearchpeer-review

1 Citation (Scopus)
2012

Reliability oriented design of power supplies for high energy physics applications

Baccaro, S., Busatto, G., Citterio, M., Cova, P., Delmonte, N., Iannuzzo, F., Lanza, A., Riva, M., Sanseverino, A. & Spiazzi, G., 1 Sep 2012, In : Microelectronics Reliability. 52, 9-10, p. 2465-2470 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

14 Citations (Scopus)
2016

A Temperature-Dependent Thermal Model of IGBT Modules Suitable for Circuit-Level Simulations

Wu, R., Wang, H., Pedersen, K. B., Ma, K., Ghimire, P., Iannuzzo, F. & Blaabjerg, F., Jul 2016, In : I E E E Transactions on Industry Applications. 52, 4, p. 3306 - 3314 9 p.

Research output: Contribution to journalJournal articleResearchpeer-review

32 Citations (Scopus)
2019

Enhancement of Thermo-mechanical Behavior of IGBT Modules through Engineered Threshold Voltages

Akbari, M., Reigosa, P. D., Bahman, A. S., Ceccarelli, L., Iannuzzo, F. & Bina, M. T., Sep 2019, Proceedings of 2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe). IEEE Press, 9 p. 8915545

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

A 3D thermal network model for monitoring imbalanced thermal distribution of press-pack IGBT modules in MMC-HVDC applications

Chang, Y., Li, W., Luo, H., He, X., Iannuzzo, F., Blaabjerg, F. & Lin, W., Apr 2019, In : Energies. 12, 7, 20 p., 1319.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
1 Citation (Scopus)
17 Downloads (Pure)

Cost-Effective Prognostics of IGBT Bond Wires With Consideration of Temperature Swing

Hu, K., Liu, Z., Du, H., Ceccarelli, L., Iannuzzo, F., Blaabjerg, F. & Tasiu, I. A., 16 Dec 2019, In : I E E E Transactions on Power Electronics. 35, 7, p. 6773-6784 12 p.

Research output: Contribution to journalJournal articleResearchpeer-review

2015

Junction temperature estimation method for a 600 V, 30A IGBT module during converter operation

Choi, U. M., Blaabjerg, F., Iannuzzo, F. & Jørgensen, S., Aug 2015, Proceedings of the 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis: SI:Proceedings of ESREF 2015. Perdu, P., Marc, F., Bafleur, M., Fremont, H. & Nohlier, N. (eds.). Elsevier, p. 2022-2026 5 p. (Microelectronics Reliability; No. 9-10, Vol. 55).

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

26 Citations (Scopus)

Robustness of MW-Level IGBT modules against gate oscillations under short circuit events

Reigosa, P. D., Wu, R., Iannuzzo, F. & Blaabjerg, F., 1 Aug 2015, In : Microelectronics Reliability. 55, 9-10, p. 1950-1955 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

17 Citations (Scopus)
2017

Simultaneous On-State Voltage and Bond-Wire Resistance Monitoring of Silicon Carbide MOSFETs

Baker, N., Luo, H. & Iannuzzo, F., Mar 2017, In : Energies. 10, 3, 8 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
17 Citations (Scopus)
209 Downloads (Pure)

A Fast Electro-Thermal Co-Simulation Modeling Approach for SiC Power MOSFETs

Ceccarelli, L., Bahman, A. S., Iannuzzo, F. & Blaabjerg, F., Mar 2017, Proceedings of the 2017 IEEE Applied Power Electronics Conference and Exposition (APEC). IEEE Press, p. 966-973 8 p. (IEEE Applied Power Electronics Conference and Exposition (APEC)).

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Open Access
File
13 Citations (Scopus)
678 Downloads (Pure)

Uneven temperature effect evaluation in high-power IGBT inverter legs and relative test platform design

Luo, H., Li, W., He, X., Iannuzzo, F. & Blaabjerg, F., Sep 2017, In : Microelectronics Reliability. 76-77, p. 123-130 8 p.

Research output: Contribution to journalConference article in JournalResearchpeer-review

3 Citations (Scopus)

Elimination of bus voltage impact on temperature sensitive electrical parameter during turn-on transition for junction temperature estimation of high-power IGBT modules

Luo, H., Iannuzzo, F., Blaabjerg, F., Wang, X. & Li, W., Oct 2017, Proceedings of 2017 IEEE Energy Conversion Congress and Exposition (ECCE). IEEE Press, p. 5892-5898 7 p.

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

2 Citations (Scopus)

Active Thermal Control by Controlled Shoot-through of Power Devices

Soldati, A., Concari, C., Barater, D., Iannuzzo, F. & Blaabjerg, F., Oct 2017, Proceedings of 43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017. IEEE Press, p. 4363-4368 6 p.

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

3 Citations (Scopus)
2018

Increasing emitter efficiency in 3.3-kV enhanced trench IGBTs for higher short-circuit capability

Reigosa, P. D., Iannuzzo, F., Rahimo, M., Corvasce, C. & Blaabjerg, F., Mar 2018, APEC 2018 - 33rd Annual IEEE Applied Power Electronics Conference and Exposition. IEEE, p. 1722-1728 7 p. (IEEE Applied Power Electronics Conference and Exposition (APEC)).

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

File
4 Citations (Scopus)
195 Downloads (Pure)
2017

Separation Test Method for Investigation of Current Density Effects on Bond Wires of SiC Power MOSFET Modules

Luo, H., Iannuzzo, F., Blaabjerg, F., Li, W. & He, X., Oct 2017, Proceedings of 43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017. IEEE Press, p. 1525-1530 6 p.

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

8 Citations (Scopus)
2016

Active gate driving method for reliability improvement of IGBTs via junction temperature swing reduction

Luo, H., Iannuzzo, F., Ma, K., Blaabjerg, F., Li, W. & He, X., Jun 2016, Proceedings of 7th International Symposium on Power Electronics for Distributed Generation Systems (PEDG), 2016 IEEE. IEEE Press, 7 p.

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

11 Citations (Scopus)
2018

Lock-in Thermography Failure Detection on Multilayer Ceramic Capacitors After Flex Cracking and Temperature-Humidity-Bias Stress

Andersson, C., Kristensen, O., Miller, S., Gloor, T. & Iannuzzo, F., 1 Dec 2018, In : IEEE Journal of Emerging and Selected Topics in Power Electronics. 6, 4, p. 2254-2261 8 p., 8444369.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
325 Downloads (Pure)
2019

Impact of the Case Temperature on the Reliability of SiC MOSFETs Under Repetitive Short Circuit Tests

Du, H., Reigosa, P. D., Iannuzzo, F. & Ceccarelli, L., 24 May 2019, 34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019. IEEE Press, p. 332-337 6 p. 8722300. (I E E E Applied Power Electronics Conference and Exposition. Conference Proceedings).

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Open Access
File
17 Downloads (Pure)
2018

Solder layer degradation measurement for SiC-MOSFET Modules under accelerated power cycling conditions

Luo, H., Iannuzzo, F. & Blaabjerg, F., Mar 2018, Proceedings of CIPS 2018; 10th International Conference on Integrated Power Electronics Systems. Germany: VDE Verlag GMBH, p. 274-278 5 p.

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Open Access
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12 Downloads (Pure)
2019

Reliability analysis of a 3-leg 4-wire inverter under unbalanced loads and harmonic injection

Lledo-Ponsati, T., Bahman, A. S., Iannuzzo, F., Montesinos-Miracle, D. & Arellano, S. G., Jun 2019, Proceedings of 2019 20th Workshop on Control and Modeling for Power Electronics (COMPEL). IEEE Signal Processing Society, 8769662. (IEEE Workshop on Control and Modeling for Power Electronics (COMPEL) ).

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

2017

Impact of bending speed and setup on flex cracks in multilayer ceramic capacitors

Andersson, C., Kristensen, O., Varescon, E. & Iannuzzo, F., Aug 2017, Proceedings of 2017 IEEE 11th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED). IEEE Press

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

2018

Failure analysis of a degraded 1.2 kV SiC MOSFET after short circuit at high temperature

Reigosa, P. D., Iannuzzo, F. & Ceccarelli, L., Jul 2018, Proceedings of the IPFA 2018 - 25th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IEEE Press, Vol. 2018-July. p. 1-5 5 p. 8452575. (IEEE International Symposium on Physical & Failure Analysis of Integrated Circuit (IPFA)).

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Open Access
File
1 Citation (Scopus)
119 Downloads (Pure)