Fingerprint
Dive into the research topics of 'A 3-D simulation study about Single Event Gate damage in medium voltage power MOSFET'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
A. Porzio*, F. Velardi, G. Busatto, F. Iannuzzo, A. Sanseverino, G. Currò
Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review