A Bayesian approach to crack detection in electrically conducting media

Kim Emil Andersen, Stephen P. Brooks, Martin Bøgsted Hansen

Research output: Book/ReportReportResearch

Original languageEnglish
Place of PublicationAalborg
PublisherAalborg Universitetsforlag
Publication statusPublished - 2000
SeriesResearch Report Series
NumberR-00-2019
ISSN1399-2503

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