A Compact P⁺ Contact Resistance Model for Characterization of Substrate Coupling in Modern Lightly Doped CMOS Processes

Ming Shen, Jan H. Mikkelsen, Ole Kiel Jensen, Torben Larsen

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

9 Citations (Scopus)
1046 Downloads (Pure)

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