A Localized–Protection Scheme for Ring DC Microgrids using Distribution-Sensitive Poverty Index

Navid Bayati, Fateme Aghaee, Amin Hajizadeh, Mohsen Soltani, Zhengyu Lin

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Abstract

DC Microgrid protection is one of the challenges in utilizing DC Microgrids. This paper offers a protection scheme for DC Microgrids with ring configuration by using local intelligent electronic devices. This method is based on monitoring the distribution-sensitive poverty index, which is calculated by using the current in different sample times. Moreover, this protection method only uses the local data at the intelligent electronic devices without using any communication links; thus, it increases the reliability and also decreases the cost of the protection system. In addition, the proposed scheme is capable of detecting the high impedance faults within the DC Microgrid lines. The effectiveness of the proposed strategy is demonstrated by using simulations in different scenarios. Simulation results indicate that the proposed method can detect both low and high impedance faults within several milliseconds, and the comparison with other fault detection methods reveals the superiority of the proposed strategy.
Original languageEnglish
Title of host publication2021 12th Power Electronics, Drive Systems, and Technologies Conference (PEDSTC)
Number of pages5
PublisherIEEE Communications Society
Publication date4 Feb 2021
Pages1-5
Article number9405880
ISBN (Print)978-1-6654-4772-0
ISBN (Electronic)9780738111971
DOIs
Publication statusPublished - 4 Feb 2021
Event2021 12th Power Electronics, Drive Systems, and Technologies Conference (PEDSTC) - Tabriz, Iran
Duration: 2 Feb 20214 Feb 2021

Conference

Conference2021 12th Power Electronics, Drive Systems, and Technologies Conference (PEDSTC)
LocationTabriz, Iran
Period02/02/202104/02/2021

Keywords

  • Measurement units
  • Simulation
  • Microgrids
  • Power electronics
  • Indexes
  • Impedance
  • Reliability
  • Localized protection scheme
  • high fault resistance
  • fault detection
  • Protection
  • DC Microgrid

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