Abstract
DC Microgrid protection is one of the challenges in utilizing DC Microgrids. This paper offers a protection scheme for DC Microgrids with ring configuration by using local intelligent electronic devices. This method is based on monitoring the distribution-sensitive poverty index, which is calculated by using the current in different sample times. Moreover, this protection method only uses the local data at the intelligent electronic devices without using any communication links; thus, it increases the reliability and also decreases the cost of the protection system. In addition, the proposed scheme is capable of detecting the high impedance faults within the DC Microgrid lines. The effectiveness of the proposed strategy is demonstrated by using simulations in different scenarios. Simulation results indicate that the proposed method can detect both low and high impedance faults within several milliseconds, and the comparison with other fault detection methods reveals the superiority of the proposed strategy.
Original language | English |
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Title of host publication | 2021 12th Power Electronics, Drive Systems, and Technologies Conference (PEDSTC) |
Number of pages | 5 |
Publisher | IEEE Communications Society |
Publication date | 4 Feb 2021 |
Pages | 1-5 |
Article number | 9405880 |
ISBN (Print) | 978-1-6654-4772-0 |
ISBN (Electronic) | 978-1-6654-0366-5 |
DOIs | |
Publication status | Published - 4 Feb 2021 |
Event | 2021 12th Power Electronics, Drive Systems, and Technologies Conference (PEDSTC) - Tabriz, Iran Duration: 2 Feb 2021 → 4 Feb 2021 |
Conference
Conference | 2021 12th Power Electronics, Drive Systems, and Technologies Conference (PEDSTC) |
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Location | Tabriz, Iran |
Period | 02/02/2021 → 04/02/2021 |
Keywords
- Measurement units
- Simulation
- Microgrids
- Power electronics
- Indexes
- Impedance
- Reliability
- Localized protection scheme
- high fault resistance
- fault detection
- Protection
- DC Microgrid