A Method for Measuring Substrate Noise in the UWB Frequency Band on Lightly Doped Substrates

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

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Original language	English
Title of host publication	Norchip, 2007
Publisher	Electrical Engineering/Electronics, Computer, Communications and Information Technology Association
Publication date	2007
ISBN (Print)	1-4244-1517-9
DOIs	https://doi.org/10.1109/NORCHP.2007.4481057
Publication status	Published - 2007
Event	IEEE 25th Norchip Conference - Aalborg, Denmark Duration: 19 Nov 2007 → 20 Nov 2007 Conference number: 25

@inproceedings{0336a000c43311dc8dd8000ea68e967b,

title = "A Method for Measuring Substrate Noise in the UWB Frequency Band on Lightly Doped Substrates",

author = "Ming Shen and Tian Tong and Mikkelsen, {Jan H.} and Torben Larsen",

year = "2007",

doi = "10.1109/NORCHP.2007.4481057",

language = "English",

isbn = "1-4244-1517-9",

booktitle = "Norchip, 2007",

publisher = "Electrical Engineering/Electronics, Computer, Communications and Information Technology Association",

note = "null ; Conference date: 19-11-2007 Through 20-11-2007",

}

Norchip, 2007. Electrical Engineering/Electronics, Computer, Communications and Information Technology Association, 2007.

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

TY - GEN

T1 - A Method for Measuring Substrate Noise in the UWB Frequency Band on Lightly Doped Substrates

AU - Shen, Ming

AU - Tong, Tian

AU - Mikkelsen, Jan H.

AU - Larsen, Torben

N1 - Conference code: 25

PY - 2007

Y1 - 2007

U2 - 10.1109/NORCHP.2007.4481057

DO - 10.1109/NORCHP.2007.4481057

M3 - Article in proceeding

SN - 1-4244-1517-9

BT - Norchip, 2007

PB - Electrical Engineering/Electronics, Computer, Communications and Information Technology Association

Y2 - 19 November 2007 through 20 November 2007

ER -