A Method for Measuring Substrate Noise in the UWB Frequency Band on Lightly Doped Substrates

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Original languageEnglish
Title of host publicationNorchip, 2007
PublisherElectrical Engineering/Electronics, Computer, Communications and Information Technology Association
Publication date2007
ISBN (Print)1-4244-1517-9
DOIs
Publication statusPublished - 2007
EventIEEE 25th Norchip Conference - Aalborg, Denmark
Duration: 19 Nov 200720 Nov 2007
Conference number: 25

Conference

ConferenceIEEE 25th Norchip Conference
Number25
CountryDenmark
CityAalborg
Period19/11/200720/11/2007

Cite this

Shen, M., Tong, T., Mikkelsen, J. H., & Larsen, T. (2007). A Method for Measuring Substrate Noise in the UWB Frequency Band on Lightly Doped Substrates. In Norchip, 2007 Electrical Engineering/Electronics, Computer, Communications and Information Technology Association. https://doi.org/10.1109/NORCHP.2007.4481057