A Methodology for Rapid Estimation of Junction Temperature of Power Semiconductors Considering Mission Profiles

Omid Alavi, Amir Sajjad Bahman

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

Abstract

This paper presents a 3D model to determine the junction temperature of power semiconductors based on the input mission profiles. For this purpose, a grid-connected wind energy conversion system, including a three-level diode-clamped converter is selected as the case study. This model will be extracted by simulating the whole system, then calculating the power losses using the lookup tables, and predicting the junction temperature using a thermal modeling method. By adopting this procedure for different input ambient temperatures and wind speeds, a 3D model can be created. Thus, for the long-term thermal analysis with enormous number of input data points, we will use this obtained model instead of running the whole simulation cycle over and over again. This will easily generate the junction temperatures for hundreds of thousands of mission profile data in a few seconds.
Original languageEnglish
Title of host publicationProceedings of 2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)
Number of pages6
PublisherIEEE Press
Publication dateJun 2019
Pages2359-2364
Article number8781177
ISBN (Electronic)978-1-7281-3666-0
DOIs
Publication statusPublished - Jun 2019
Event2019 IEEE 28th International Symposium on Industrial Electronics (ISIE) - Vancouver, Canada
Duration: 12 Jun 201914 Jun 2019

Conference

Conference2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)
Country/TerritoryCanada
CityVancouver
Period12/06/201914/06/2019
SeriesIndustrial Electronics (ISIE), IEEE International Symposium on
ISSN2163-5137

Keywords

  • IGBT module
  • Mission profile
  • Power electronics
  • Thermal management
  • Wind turbine

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