A multi-port thermal coupling model for multi-chip power modules suitable for circuit simulators

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Abstract

This paper investigates two compact thermal model representations for multi-chip power modules, namely the thermal impedance matrix model and the thermal admittance matrix model. The latter can shape a multi-port thermal network without controlled temperature sources, and can be readily implemented in circuit simulators. The mutual transformation between the two models and their relationship to parameters in the multi-port network are revealed. In addition, practical tips for thermal model parameter extractions based on temperature measurements and curve-fitting are discussed. The multi-port thermal model is verified by simulations and experimental results. It confirms that more accurate temperature estimation can be achieved compared with the thermal model without the thermal coupling effect.
Original languageEnglish
JournalMicroelectronics Reliability
Volume88-90
Pages (from-to)519-523
Number of pages5
ISSN0026-2714
DOIs
Publication statusPublished - Sept 2018
Event29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - AKKC, Aalborg, Denmark
Duration: 1 Oct 20185 Oct 2018
Conference number: 29th
http://www.esref2018conf.org/

Conference

Conference29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
Number29th
LocationAKKC
Country/TerritoryDenmark
CityAalborg
Period01/10/201805/10/2018
Internet address

Keywords

  • Thermal model
  • Multi-chip power module

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