A New Lumped-Charge Modeling Method for Power Semiconductor Devices

Research output: Contribution to journalJournal articleResearchpeer-review

31 Downloads (Pure)

Abstract

This article proposes a new lumped-charge model for power semiconductor devices. The existing lumped-charge model, due to its linear modeling method, has some limitations that will impair the accuracy of the model. First, this article analyses the restriction of the traditional lumped-charge modeling method. Then, based on the limitation analysis, a new lumped-charge modeling method is presented and improves the accuracy of the traditional one while keeping its advantages. In this new model, the relationship between the ambipolar current and the LCs in the power devices is redefined. Finally, the new method is implemented to an insulated-gate bipolar transistor (IGBT) model and a PiN freewheeling diode. The accuracy of the models is verified by experiment including both the static and transient characteristics and compared with the traditional IGBT model.
Original languageEnglish
Article number8818346
JournalI E E E Transactions on Power Electronics
Volume35
Issue number4
Pages (from-to)3989 - 3996
Number of pages8
ISSN0885-8993
DOIs
Publication statusPublished - Apr 2020

Keywords

  • Insulated gate bipolar transistor (IGBT)
  • lumped-charge model
  • power semiconductor devices models

Fingerprint Dive into the research topics of 'A New Lumped-Charge Modeling Method for Power Semiconductor Devices'. Together they form a unique fingerprint.

Cite this