A Photovoltaic Module Diagnostic Setup for Lock-in Electroluminescence Imaging

Harsh Rajesh Parikh, Sergiu Viorel Spataru, Dezso Séra, Gisele A. dos Reis Benatto, Peter Poulsen, Claire Mantel, Soren Forchhammer, Michael Larsen, Kenn H. B. Frederiksen, Jan Vedde

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

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Electroluminescence (EL) imaging and infrared (IRT) thermography techniques have become indispensable tools in recent years for health diagnostic of photovoltaic modules in solar industry application. We propose a diagnostic setup, which performs lock-in EL for accurate analysis of different types of faults occurring in a solar module. The setup is built around a high-speed SWIR camera, which can acquire images at very short integration time (1μs) and high frame rate (301 fps). In addition, a state-of-the-art imaging chamber allows for introducing controlled levels of ambient light noise for developing new light noise removal methods, rotation of panel frame in 3 axes plane for developing perspective distortion correction techniques. The paper also gives an insight of different system and communication delays that affects the performance of overall EL lock-in imaging system integration. The purpose of the diagnostic setup is to support research in PV failure quantification through EL imaging, which can also be useful for aerial drone imaging of PV plants
Original languageEnglish
Title of host publicationProceedings of 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)
Number of pages6
PublisherIEEE Press
Publication dateJun 2019
Article number0160-8371
ISBN (Print)978-1-7281-0495-9
ISBN (Electronic)978-1-7281-0494-2
Publication statusPublished - Jun 2019
Event2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) - Chicago, United States
Duration: 16 Jun 201921 Jun 2019


Conference2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)
CountryUnited States
SeriesI E E E Photovoltaic Specialists Conference. Conference Record


  • EL imaging
  • Lock-in technique
  • Ambient noise level
  • Perspective distortion
  • Lock-in measurement procedure
  • System delays

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