This letter proposes a simplified converter-level on-state voltage measurement circuit for power semiconductor devices, without an external power supply and self-power circuit. It has a reduced component count and circuit complexity, and retains the plug-and-play feature, comparable measurement accuracy, and dynamic response as recently reported methods. A proof-of-concept prototype is developed and tested for a three-phase inverter application.
|Journal||I E E E Transactions on Power Electronics|
|Number of pages||5|
|Publication status||Accepted/In press - Apr 2021|
- condition monitoring
- Power semiconductor
- on-state voltage