A Simplified On-state Voltage Measurement Circuit for Power Semiconductor Devices

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

This letter proposes a simplified converter-level on-state voltage measurement circuit for power semiconductor devices, without an external power supply and self-power circuit. It has a reduced component count and circuit complexity, and retains the plug-and-play feature, comparable measurement accuracy, and dynamic response as recently reported methods. A proof-of-concept prototype is developed and tested for a three-phase inverter application.
Original languageEnglish
JournalI E E E Transactions on Power Electronics
Pages (from-to)1-1
Number of pages5
ISSN1941-0107
Publication statusAccepted/In press - Apr 2021

Keywords

  • reliability
  • condition monitoring
  • Power semiconductor
  • on-state voltage

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