A Temperature-dependent Thermal Model of Silicon Carbide MOSFET Module for Long-term Reliability Assessment

Mengxing Chen, Huai Wang, Frede Blaabjerg, Xiongfei Wang, Donghua Pan

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

9 Citations (Scopus)
1 Downloads (Pure)

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