A time-resolved IBICC experiment using the IEEM of the SIRAD facility

L. Silvestrin; D. Bisello; G. Busatto; P. Giubilato; Francesco Iannuzzo; S. Mattiazzo; D. Pantano; A. Sanseverino; M. Tessaro; F. Velardi; J. Wyss

doi:10.1016/j.nimb.2011.07.083

A time-resolved IBICC experiment using the IEEM of the SIRAD facility

L. Silvestrin^*, D. Bisello, G. Busatto, P. Giubilato, Francesco Iannuzzo, S. Mattiazzo, D. Pantano, A. Sanseverino, M. Tessaro, F. Velardi, J. Wyss

^*Corresponding author for this work

Research output: Contribution to journal › Conference article in Journal › Research › peer-review

5 Citations (Scopus)

Abstract

The Ion Electron Emission Microscope (IEEM) of the SIRAD irradiation facility at LNL (Legnaro, Italy) has been used to perform an Ion Beam Induced Charge Collection (IBICC) type experiment irradiating a power MOSFET device with 223 MeV 79Br ions. The ion-induced drain current pulse signals at different bias conditions were correlated with the ion impacts reconstructed by the IEEM to disentangle, with micrometric resolution, regions of the device with different sensitivity to the impinging ions.

Original language	English
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	273
Pages (from-to)	234-236
Number of pages	3
ISSN	0168-583X
DOIs	https://doi.org/10.1016/j.nimb.2011.07.083
Publication status	Published - 15 Feb 2012
Externally published	Yes
Event	20th International Conference on Ion Beam Analysis - Itapema, Brazil Duration: 10 Apr 2011 → 15 Apr 2011

Conference

Conference	20th International Conference on Ion Beam Analysis
Country/Territory	Brazil
City	Itapema
Period	10/04/2011 → 15/04/2011

Keywords

IBICC
Ion Electron Emission Microscopy
MOSFET

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Silvestrin, L., Bisello, D., Busatto, G., Giubilato, P., Iannuzzo, F., Mattiazzo, S., Pantano, D., Sanseverino, A., Tessaro, M., Velardi, F., & Wyss, J. (2012). A time-resolved IBICC experiment using the IEEM of the SIRAD facility. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 273, 234-236. https://doi.org/10.1016/j.nimb.2011.07.083

@inproceedings{f330793cd94d4bfb91d1ec57bd0ce41f,

title = "A time-resolved IBICC experiment using the IEEM of the SIRAD facility",

abstract = "The Ion Electron Emission Microscope (IEEM) of the SIRAD irradiation facility at LNL (Legnaro, Italy) has been used to perform an Ion Beam Induced Charge Collection (IBICC) type experiment irradiating a power MOSFET device with 223 MeV 79Br ions. The ion-induced drain current pulse signals at different bias conditions were correlated with the ion impacts reconstructed by the IEEM to disentangle, with micrometric resolution, regions of the device with different sensitivity to the impinging ions.",

keywords = "IBICC, Ion Electron Emission Microscopy, MOSFET",

author = "L. Silvestrin and D. Bisello and G. Busatto and P. Giubilato and Francesco Iannuzzo and S. Mattiazzo and D. Pantano and A. Sanseverino and M. Tessaro and F. Velardi and J. Wyss",

year = "2012",

month = feb,

day = "15",

doi = "10.1016/j.nimb.2011.07.083",

language = "English",

volume = "273",

pages = "234--236",

journal = "Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms",

issn = "0168-583X",

publisher = "Elsevier",

note = "20th International Conference on Ion Beam Analysis ; Conference date: 10-04-2011 Through 15-04-2011",

}

Silvestrin, L, Bisello, D, Busatto, G, Giubilato, P, Iannuzzo, F, Mattiazzo, S, Pantano, D, Sanseverino, A, Tessaro, M, Velardi, F & Wyss, J 2012, 'A time-resolved IBICC experiment using the IEEM of the SIRAD facility', Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, vol. 273, pp. 234-236. https://doi.org/10.1016/j.nimb.2011.07.083

TY - GEN

T1 - A time-resolved IBICC experiment using the IEEM of the SIRAD facility

AU - Silvestrin, L.

AU - Bisello, D.

AU - Busatto, G.

AU - Giubilato, P.

AU - Iannuzzo, Francesco

AU - Mattiazzo, S.

AU - Pantano, D.

AU - Sanseverino, A.

AU - Tessaro, M.

AU - Velardi, F.

AU - Wyss, J.

PY - 2012/2/15

Y1 - 2012/2/15

N2 - The Ion Electron Emission Microscope (IEEM) of the SIRAD irradiation facility at LNL (Legnaro, Italy) has been used to perform an Ion Beam Induced Charge Collection (IBICC) type experiment irradiating a power MOSFET device with 223 MeV 79Br ions. The ion-induced drain current pulse signals at different bias conditions were correlated with the ion impacts reconstructed by the IEEM to disentangle, with micrometric resolution, regions of the device with different sensitivity to the impinging ions.

AB - The Ion Electron Emission Microscope (IEEM) of the SIRAD irradiation facility at LNL (Legnaro, Italy) has been used to perform an Ion Beam Induced Charge Collection (IBICC) type experiment irradiating a power MOSFET device with 223 MeV 79Br ions. The ion-induced drain current pulse signals at different bias conditions were correlated with the ion impacts reconstructed by the IEEM to disentangle, with micrometric resolution, regions of the device with different sensitivity to the impinging ions.

KW - IBICC

KW - Ion Electron Emission Microscopy

KW - MOSFET

U2 - 10.1016/j.nimb.2011.07.083

DO - 10.1016/j.nimb.2011.07.083

M3 - Conference article in Journal

AN - SCOPUS:84856092130

SN - 0168-583X

VL - 273

SP - 234

EP - 236

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

T2 - 20th International Conference on Ion Beam Analysis

Y2 - 10 April 2011 through 15 April 2011

ER -

A time-resolved IBICC experiment using the IEEM of the SIRAD facility

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Keywords

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