A time-resolved IBICC experiment using the IEEM of the SIRAD facility

L. Silvestrin*, D. Bisello, G. Busatto, P. Giubilato, Francesco Iannuzzo, S. Mattiazzo, D. Pantano, A. Sanseverino, M. Tessaro, F. Velardi, J. Wyss

*Corresponding author

Research output: Contribution to journalConference article in JournalResearchpeer-review

5 Citations (Scopus)

Abstract

The Ion Electron Emission Microscope (IEEM) of the SIRAD irradiation facility at LNL (Legnaro, Italy) has been used to perform an Ion Beam Induced Charge Collection (IBICC) type experiment irradiating a power MOSFET device with 223 MeV 79Br ions. The ion-induced drain current pulse signals at different bias conditions were correlated with the ion impacts reconstructed by the IEEM to disentangle, with micrometric resolution, regions of the device with different sensitivity to the impinging ions.
Original languageEnglish
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume273
Pages (from-to)234-236
Number of pages3
ISSN0168-583X
DOIs
Publication statusPublished - 15 Feb 2012
Externally publishedYes
Event20th International Conference on Ion Beam Analysis - Itapema, Brazil
Duration: 10 Apr 201115 Apr 2011

Conference

Conference20th International Conference on Ion Beam Analysis
CountryBrazil
CityItapema
Period10/04/201115/04/2011

Keywords

  • IBICC
  • Ion Electron Emission Microscopy
  • MOSFET

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