Accelerated Testing and Modeling of Potential-Induced Degradation as a Function of Temperature and Relative Humidity

Peter Hacke; Sergiu Spataru; Kent Terwilliger; Greg Perrin; Stephen Glick; Sarah Kurtz; John Wohlgemuth

doi:10.1109/PVSC.2015.7355627

Accelerated Testing and Modeling of Potential-Induced Degradation as a Function of Temperature and Relative Humidity

Peter Hacke, Sergiu Spataru, Kent Terwilliger, Greg Perrin, Stephen Glick, Sarah Kurtz, John Wohlgemuth

AAU Energy

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

7 Citations (Scopus)

Abstract

An acceleration model based on the Peck equation was applied to power performance of crystalline silicon cell modules as a function of time and of temperature and humidity, the two main environmental stress factors that promote potential-induced degradation. This model was derived from module power degradation data obtained semi-continuously and statistically by in-situ dark current-voltage measurements in an environmental chamber. The modeling enables prediction of degradation rates and times as functions of temperature and humidity. Power degradation could be modeled linearly as a function of time to the second power; additionally, we found that coulombs transferred from the active cell circuit to ground during the stress test is approximately linear with time. Therefore, the power loss could be linearized as a function of coulombs squared. With this result, we observed that when the module face was completely grounded with a condensed phase conductor, leakage current exceeded the anticipated corresponding degradation rate relative to the other tests performed in damp heat.

Original language	English
Title of host publication	Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
Number of pages	5
Publisher	IEEE Press
Publication date	2015
Pages	1-5
ISBN (Electronic)	978-1-4799-7944-8
DOIs	https://doi.org/10.1109/PVSC.2015.7355627
Publication status	Published - 2015
Event	42nd IEEE Photovoltaic Specialists Conference - New Orleans, LA, United States Duration: 14 Jun 2015 → 19 Jun 2015 Conference number: 42

Conference

Conference	42nd IEEE Photovoltaic Specialists Conference
Number	42
Country/Territory	United States
City	New Orleans, LA
Period	14/06/2015 → 19/06/2015

Series	I E E E Photovoltaic Specialists Conference. Conference Record
Volume	42
ISSN	0160-8371

Keywords

Photovoltaic modules
Potential-induced degradation
Silicon
Solar cells

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10.1109/PVSC.2015.7355627

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SPVSYS: Smart Photovoltaic Systems
Teodorescu, R., Séra, D., Kerekes, T., Borup, U., Spataru, S. V. & Bogdan, C.
ForskEL
01/01/2011 → 31/07/2015
Project: Research

Cite this

@inproceedings{e3b3e3d5872f4b04bdc618cde95d70ad,

title = "Accelerated Testing and Modeling of Potential-Induced Degradation as a Function of Temperature and Relative Humidity",

abstract = "An acceleration model based on the Peck equation was applied to power performance of crystalline silicon cell modules as a function of time and of temperature and humidity, the two main environmental stress factors that promote potential-induced degradation. This model was derived from module power degradation data obtained semi-continuously and statistically by in-situ dark current-voltage measurements in an environmental chamber. The modeling enables prediction of degradation rates and times as functions of temperature and humidity. Power degradation could be modeled linearly as a function of time to the second power; additionally, we found that coulombs transferred from the active cell circuit to ground during the stress test is approximately linear with time. Therefore, the power loss could be linearized as a function of coulombs squared. With this result, we observed that when the module face was completely grounded with a condensed phase conductor, leakage current exceeded the anticipated corresponding degradation rate relative to the other tests performed in damp heat.",

keywords = "Photovoltaic modules, Potential-induced degradation, Silicon, Solar cells",

author = "Peter Hacke and Sergiu Spataru and Kent Terwilliger and Greg Perrin and Stephen Glick and Sarah Kurtz and John Wohlgemuth",

year = "2015",

doi = "10.1109/PVSC.2015.7355627",

language = "English",

series = "I E E E Photovoltaic Specialists Conference. Conference Record",

publisher = "IEEE Press",

pages = "1--5",

booktitle = "Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)",

note = "42nd IEEE Photovoltaic Specialists Conference, 42nd IEEE PVSC ; Conference date: 14-06-2015 Through 19-06-2015",

}

Hacke, P, Spataru, S, Terwilliger, K, Perrin, G, Glick, S, Kurtz, S & Wohlgemuth, J 2015, Accelerated Testing and Modeling of Potential-Induced Degradation as a Function of Temperature and Relative Humidity. in Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC). IEEE Press, I E E E Photovoltaic Specialists Conference. Conference Record, vol. 42, pp. 1-5, 42nd IEEE Photovoltaic Specialists Conference, New Orleans, LA, United States, 14/06/2015. https://doi.org/10.1109/PVSC.2015.7355627

Accelerated Testing and Modeling of Potential-Induced Degradation as a Function of Temperature and Relative Humidity. / Hacke, Peter; Spataru, Sergiu; Terwilliger, Kent et al.
Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC). IEEE Press, 2015. p. 1-5 (I E E E Photovoltaic Specialists Conference. Conference Record, Vol. 42).

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

TY - GEN

T1 - Accelerated Testing and Modeling of Potential-Induced Degradation as a Function of Temperature and Relative Humidity

AU - Hacke, Peter

AU - Spataru, Sergiu

AU - Terwilliger, Kent

AU - Perrin, Greg

AU - Glick, Stephen

AU - Kurtz, Sarah

AU - Wohlgemuth, John

N1 - Conference code: 42

PY - 2015

Y1 - 2015

N2 - An acceleration model based on the Peck equation was applied to power performance of crystalline silicon cell modules as a function of time and of temperature and humidity, the two main environmental stress factors that promote potential-induced degradation. This model was derived from module power degradation data obtained semi-continuously and statistically by in-situ dark current-voltage measurements in an environmental chamber. The modeling enables prediction of degradation rates and times as functions of temperature and humidity. Power degradation could be modeled linearly as a function of time to the second power; additionally, we found that coulombs transferred from the active cell circuit to ground during the stress test is approximately linear with time. Therefore, the power loss could be linearized as a function of coulombs squared. With this result, we observed that when the module face was completely grounded with a condensed phase conductor, leakage current exceeded the anticipated corresponding degradation rate relative to the other tests performed in damp heat.

AB - An acceleration model based on the Peck equation was applied to power performance of crystalline silicon cell modules as a function of time and of temperature and humidity, the two main environmental stress factors that promote potential-induced degradation. This model was derived from module power degradation data obtained semi-continuously and statistically by in-situ dark current-voltage measurements in an environmental chamber. The modeling enables prediction of degradation rates and times as functions of temperature and humidity. Power degradation could be modeled linearly as a function of time to the second power; additionally, we found that coulombs transferred from the active cell circuit to ground during the stress test is approximately linear with time. Therefore, the power loss could be linearized as a function of coulombs squared. With this result, we observed that when the module face was completely grounded with a condensed phase conductor, leakage current exceeded the anticipated corresponding degradation rate relative to the other tests performed in damp heat.

KW - Photovoltaic modules

KW - Potential-induced degradation

KW - Silicon

KW - Solar cells

U2 - 10.1109/PVSC.2015.7355627

DO - 10.1109/PVSC.2015.7355627

M3 - Article in proceeding

T3 - I E E E Photovoltaic Specialists Conference. Conference Record

SP - 1

EP - 5

BT - Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)

PB - IEEE Press

T2 - 42nd IEEE Photovoltaic Specialists Conference

Y2 - 14 June 2015 through 19 June 2015

ER -

Hacke P, Spataru S, Terwilliger K, Perrin G, Glick S, Kurtz S et al. Accelerated Testing and Modeling of Potential-Induced Degradation as a Function of Temperature and Relative Humidity. In Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC). IEEE Press. 2015. p. 1-5. (I E E E Photovoltaic Specialists Conference. Conference Record, Vol. 42). doi: 10.1109/PVSC.2015.7355627

Accelerated Testing and Modeling of Potential-Induced Degradation as a Function of Temperature and Relative Humidity

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SPVSYS: Smart Photovoltaic Systems

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