Abstract
This paper explores the fault tolerant capabilities of an Embedded Enhanced-Boost Z-Source Inverter (EEB-ZSI) for PV applications. Compared with the prior-art Embedded Source Inverters (E-ZSI) and Enhanced-Boost Z-Source Inverter (EB-ZSI), the proposed topology features that when one dc source (e.g., PV panel) is short-circuited (SC) or open-circuited (OC), the inverter can tolerate the faults and still operate with a compromised conversion ratio. However, the conversion ratio is still larger than the traditional E-ZSI. This topology can be further applied to the cascaded H-bridge inverter systems for multi-level applications with fault-handling capabilities. A detailed fault-tolerant analysis is conducted on the EEB-ZSI and simulations are provided to validate the analysis.
| Original language | English |
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| Title of host publication | Proceedings of IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society |
| Number of pages | 6 |
| Publisher | IEEE |
| Publication date | Oct 2018 |
| Pages | 3712-3717 |
| Article number | 8591424 |
| ISBN (Print) | 978-1-5090-6685-8 |
| ISBN (Electronic) | 978-1-5090-6684-1 |
| DOIs | |
| Publication status | Published - Oct 2018 |
| Event | 44th Annual Conference of the IEEE Industrial Electronics Society - Omni Shoreham Hotel, Washington, United States Duration: 21 Oct 2018 → 23 Oct 2018 http://www.iecon2018.org/ |
Conference
| Conference | 44th Annual Conference of the IEEE Industrial Electronics Society |
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| Location | Omni Shoreham Hotel |
| Country/Territory | United States |
| City | Washington |
| Period | 21/10/2018 → 23/10/2018 |
| Internet address |
Keywords
- impedance source inverter
- embedded z-source
- fault-tolerant topology