| Original language | English |
|---|---|
| Patent number | WO/2005/052557 |
| Country/Territory | Denmark |
| Publication status | Published - 2005 |
An Examination System for Examination of a Specimen; Sub-units and Units therefore, a Sensor and a Microscope
P. Thomsen (Inventor), T. Nikolajsen (Inventor), Sergey Bozhevolnyi (Inventor), M.H. Sørensen (Inventor)
Research output: Patent