Analysis of Miller Region Sustained Oscillations during Turn-on of High-Side 10kV SiC MOSFET

Benjamin Futtrup Kjærsgaard; Asger Bjørn Jørgensen; Thore Stig Aunsborg; Jannick Kjær Jørgensen; Gao Liu; Hongbo Zhao; Stig Munk-Nielsen; Bjørn Rannestad

doi:10.23919/EPE23ECCEEurope58414.2023.10264475

Analysis of Miller Region Sustained Oscillations during Turn-on of High-Side 10kV SiC MOSFET

Benjamin Futtrup Kjærsgaard^*, Asger Bjørn Jørgensen, Thore Stig Aunsborg, Jannick Kjær Jørgensen, Gao Liu, Hongbo Zhao, Stig Munk-Nielsen, Bjørn Rannestad

^*Corresponding author for this work

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

3 Citations (Scopus)

280 Downloads (Pure)

Abstract

Sustained Miller region oscillations are observed during turn-on of the high-side SiC MOSFET in a half-bridge 10kV power module during high-side double pulse testing at 6kV, 70A. The oscillations are analyzed and the cause is identified as a positive feedback loop forming between the common source inductance and the equivalent high-side Miller capacitance, with a current path through the parasitic power module capacitive couplings of the grounded baseplate. Using custom manufactured and prototype medium voltage power modules the cause is experimentally validated and a mitigation strategy is proposed, demonstrating complete elimination of the sustained oscillations.

Original language	English
Title of host publication	2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe
Number of pages	8
Publisher	IEEE (Institute of Electrical and Electronics Engineers)
Publication date	4 Sept 2023
Article number	10264475
ISBN (Print)	979-8-3503-1678-0
ISBN (Electronic)	978-9-0758-1541-2
DOIs	https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264475
Publication status	Published - 4 Sept 2023
Event	2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe) - Aalborg, Denmark Duration: 4 Sept 2023 → 8 Sept 2023

Conference

Conference	2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)
Country/Territory	Denmark
City	Aalborg
Period	04/09/2023 → 08/09/2023

Keywords

Capacitive coupling
Double pulse test
Medium voltage
Packaging
Parasitic inductance
SiC oscillation

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10.23919/EPE23ECCEEurope58414.2023.10264475

Analysis_of_Miller_Region_Sustained_Oscillations_during_Turn-on_of_High-Side_10kV_SiC_MOSFETAccepted author manuscript, 3.78 MB

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Kjærsgaard, B. F., Jørgensen, A. B., Aunsborg, T. S., Jørgensen, J. K., Liu, G., Zhao, H., Munk-Nielsen, S., & Rannestad, B. (2023). Analysis of Miller Region Sustained Oscillations during Turn-on of High-Side 10kV SiC MOSFET. In 2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe Article 10264475 IEEE (Institute of Electrical and Electronics Engineers). https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264475

@inproceedings{871a62f2e1164286a8a7056cd8c12c14,

title = "Analysis of Miller Region Sustained Oscillations during Turn-on of High-Side 10kV SiC MOSFET",

abstract = "Sustained Miller region oscillations are observed during turn-on of the high-side SiC MOSFET in a half-bridge 10kV power module during high-side double pulse testing at 6kV, 70A. The oscillations are analyzed and the cause is identified as a positive feedback loop forming between the common source inductance and the equivalent high-side Miller capacitance, with a current path through the parasitic power module capacitive couplings of the grounded baseplate. Using custom manufactured and prototype medium voltage power modules the cause is experimentally validated and a mitigation strategy is proposed, demonstrating complete elimination of the sustained oscillations.",

keywords = "Capacitive coupling, Double pulse test, Medium voltage, Packaging, Parasitic inductance, SiC oscillation",

author = "Kj{\ae}rsgaard, {Benjamin Futtrup} and J{\o}rgensen, {Asger Bj{\o}rn} and Aunsborg, {Thore Stig} and J{\o}rgensen, {Jannick Kj{\ae}r} and Gao Liu and Hongbo Zhao and Stig Munk-Nielsen and Bj{\o}rn Rannestad",

year = "2023",

month = sep,

day = "4",

doi = "10.23919/EPE23ECCEEurope58414.2023.10264475",

language = "English",

isbn = "979-8-3503-1678-0",

booktitle = "2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe",

publisher = "IEEE (Institute of Electrical and Electronics Engineers)",

address = "United States",

note = "2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe) ; Conference date: 04-09-2023 Through 08-09-2023",

}

Kjærsgaard, BF , Jørgensen, AB , Aunsborg, TS , Jørgensen, JK , Liu, G , Zhao, H , Munk-Nielsen, S & Rannestad, B 2023, Analysis of Miller Region Sustained Oscillations during Turn-on of High-Side 10kV SiC MOSFET. in 2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe., 10264475, IEEE (Institute of Electrical and Electronics Engineers), 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe), Aalborg, Denmark, 04/09/2023. https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264475

Analysis of Miller Region Sustained Oscillations during Turn-on of High-Side 10kV SiC MOSFET. / Kjærsgaard, Benjamin Futtrup ; Jørgensen, Asger Bjørn ; Aunsborg, Thore Stig et al.
2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe. IEEE (Institute of Electrical and Electronics Engineers), 2023. 10264475.

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

TY - GEN

T1 - Analysis of Miller Region Sustained Oscillations during Turn-on of High-Side 10kV SiC MOSFET

AU - Kjærsgaard, Benjamin Futtrup

AU - Jørgensen, Asger Bjørn

AU - Aunsborg, Thore Stig

AU - Jørgensen, Jannick Kjær

AU - Liu, Gao

AU - Zhao, Hongbo

AU - Munk-Nielsen, Stig

AU - Rannestad, Bjørn

PY - 2023/9/4

Y1 - 2023/9/4

N2 - Sustained Miller region oscillations are observed during turn-on of the high-side SiC MOSFET in a half-bridge 10kV power module during high-side double pulse testing at 6kV, 70A. The oscillations are analyzed and the cause is identified as a positive feedback loop forming between the common source inductance and the equivalent high-side Miller capacitance, with a current path through the parasitic power module capacitive couplings of the grounded baseplate. Using custom manufactured and prototype medium voltage power modules the cause is experimentally validated and a mitigation strategy is proposed, demonstrating complete elimination of the sustained oscillations.

AB - Sustained Miller region oscillations are observed during turn-on of the high-side SiC MOSFET in a half-bridge 10kV power module during high-side double pulse testing at 6kV, 70A. The oscillations are analyzed and the cause is identified as a positive feedback loop forming between the common source inductance and the equivalent high-side Miller capacitance, with a current path through the parasitic power module capacitive couplings of the grounded baseplate. Using custom manufactured and prototype medium voltage power modules the cause is experimentally validated and a mitigation strategy is proposed, demonstrating complete elimination of the sustained oscillations.

KW - Capacitive coupling

KW - Double pulse test

KW - Medium voltage

KW - Packaging

KW - Parasitic inductance

KW - SiC oscillation

UR - http://www.scopus.com/inward/record.url?scp=85175159198&partnerID=8YFLogxK

U2 - 10.23919/EPE23ECCEEurope58414.2023.10264475

DO - 10.23919/EPE23ECCEEurope58414.2023.10264475

M3 - Article in proceeding

SN - 979-8-3503-1678-0

BT - 2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe

PB - IEEE (Institute of Electrical and Electronics Engineers)

T2 - 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)

Y2 - 4 September 2023 through 8 September 2023

ER -

Kjærsgaard BF , Jørgensen AB , Aunsborg TS , Jørgensen JK , Liu G , Zhao H et al. Analysis of Miller Region Sustained Oscillations during Turn-on of High-Side 10kV SiC MOSFET. In 2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe. IEEE (Institute of Electrical and Electronics Engineers). 2023. 10264475 doi: 10.23919/EPE23ECCEEurope58414.2023.10264475

Analysis of Miller Region Sustained Oscillations during Turn-on of High-Side 10kV SiC MOSFET

Abstract

Conference

Keywords

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Parasitic Capacitive and Inductive Effects in High Power Silicon Carbide enabled Power Electronics Converter Systems

MVolt: Medium Voltage Power Electronics for Wind Systems

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Analysis of Miller Region Sustained Oscillations during Turn-on of High-Side 10kV SiC MOSFET

Abstract

Conference

Keywords

Access to Document

AUB Link

Other files and links

Fingerprint

Projects

Parasitic Capacitive and Inductive Effects in High Power Silicon Carbide enabled Power Electronics Converter Systems

MVolt: Medium Voltage Power Electronics for Wind Systems

Cite this