Analysis of solar panel’s lumped equivalent circuit parameters using LASSO

Martin Garaj, Henry Shu Hung Chung, Alan Wai-Lun Lo, Huai Wang

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

2 Citations (Scopus)

Abstract

The power output of a solar panel depends on the level of degradation and external factors, such as temperature and solar irradiation. The changes in the power output caused by temperature and irradiation fluctuations coincide with the changes due to degradation. Therefore, a common way of degradation determination requires the knowledge of external factors. This work investigates a modeling of the panel power output at the reference state without the knowledge of the external factors. Firstly, a sparse regression modeling is used to identify relevant lumped equivalent circuit parameters, which capture the reference state of the solar panel. The p-n junction capacitance is found to be an important indicator of external factors tied to the panel's state of health. Secondly, a set of regression models for modelling the solar panel reference state are tested to distinguish a permanent 5% drop in power output from a regular temperature and irradiation fluctuations, without the information of the temperature and irradiation.

Original languageEnglish
Title of host publication2019 IEEE Energy Conversion Congress and Exposition, ECCE 2019
Number of pages6
PublisherIEEE
Publication dateSept 2019
Pages3427-3432
Article number8912913
ISBN (Electronic)9781728103952
DOIs
Publication statusPublished - Sept 2019
Event11th Annual IEEE Energy Conversion Congress and Exposition, ECCE 2019 - Baltimore, United States
Duration: 29 Sept 20193 Oct 2019

Conference

Conference11th Annual IEEE Energy Conversion Congress and Exposition, ECCE 2019
Country/TerritoryUnited States
CityBaltimore
Period29/09/201903/10/2019
SponsorIEEE Industry Application Society (IAS), IEEE Power Electronics Society (PELS)
SeriesIEEE Energy Conversion Congress and Exposition
ISSN2329-3721

Bibliographical note

Funding Information:
The work was supported by a grant from the Innovation Fund Denmark through the project APETT with no.: 6154-00010B.

Publisher Copyright:
© 2019 IEEE.

Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.

Keywords

  • Diagnostics
  • Photovoltaic panel
  • Regression

Fingerprint

Dive into the research topics of 'Analysis of solar panel’s lumped equivalent circuit parameters using LASSO'. Together they form a unique fingerprint.

Cite this