Analytical Modeling and Design of Capacitor Bank Considering Thermal Coupling Effect

Haoran Wang*, Huai Wang

*Corresponding author for this work

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Abstract

The inevitable electrothermal coupling among capacitors in a bank will lead to nonnegligible errors to the temperature as well as the lifetime prediction of the individual capacitor. In this article, the analytical thermal models with the corresponding design for capacitor banks are proposed considering the thermal coupling effect. First, a measurement-based lump thermal model and a physical-model-based analytical thermal model are proposed. Then, with the help of the proposed thermal models, the design method for the thermal matching of capacitors in a bank is proposed by optimizing the parameters of individual capacitors, such as the rated parameters and actual loading. To validate the accuracy of the proposed design, case studies based on a capacitor bank with nine capacitors are presented.
Original languageEnglish
Article number9162531
JournalIEEE Transactions on Power Electronics
Volume36
Issue number3
Pages (from-to)2629-2640
Number of pages12
ISSN0885-8993
DOIs
Publication statusPublished - Mar 2021

Bibliographical note

Funding Information:
Manuscript received March 29, 2020; revised June 22, 2020; accepted July 29, 2020. Date of publication August 7, 2020; date of current version October 30, 2020. This work was supported in part by the Innovation Fund Denmark through the Advanced Power Electronic Technology and Tools Project, and in part by the Project of National Natural Science Foundation of China under Grants 51777146 and 51977163. This paper was presented in part at the 10th IEEE Energy Conversion Congress and Exposition, Portland, OR, USA, September 2018, and 29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Aalborg, Denmark, October 2018. Recommended for publication by Associate Editor C. N. M. Ho. (Corresponding author: Haoran Wang.) The authors are with the Department of Energy Technology, Aalborg University, 9220 Aalborg, Denmark (e-mail: hao@et.aau.dk; hwa@et.aau.dk).

Publisher Copyright:
© 1986-2012 IEEE.

Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.

Keywords

  • Capacitor
  • power converter
  • reliability
  • thermal model

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