Assessment of the Huygens’ Box Method With Different Sources Near Obstacles

M. Sørensen, I. B. Bonev, O. Franek, G. F. Pedersen

Research output: Contribution to journalJournal articleResearchpeer-review

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Original languageEnglish
JournalIEEE Transactions on Electromagnetic Compatibility
Number of pages10
ISSN0018-9375
DOIs
Publication statusAccepted/In press - 2019

Keywords

    Cite this

    @article{7a58ad11f0b64efaaf52cf11a3eb2e92,
    title = "Assessment of the Huygens’ Box Method With Different Sources Near Obstacles",
    keywords = "Numerical models, Electromagnetic compatibility, Microstrip, Integrated circuit modeling, Resonant frequency, Predictive models, Electromagnetic simulations, Huygen’s box method, near-field scan, surface equivalence principle",
    author = "M. S{\o}rensen and Bonev, {I. B.} and O. Franek and Pedersen, {G. F.}",
    year = "2019",
    doi = "10.1109/TEMC.2019.2908354",
    language = "English",
    journal = "I E E E Transactions on Electromagnetic Compatibility",
    issn = "0018-9375",
    publisher = "IEEE",

    }

    Assessment of the Huygens’ Box Method With Different Sources Near Obstacles. / Sørensen, M.; Bonev, I. B.; Franek, O.; Pedersen, G. F.

    In: IEEE Transactions on Electromagnetic Compatibility, 2019.

    Research output: Contribution to journalJournal articleResearchpeer-review

    TY - JOUR

    T1 - Assessment of the Huygens’ Box Method With Different Sources Near Obstacles

    AU - Sørensen, M.

    AU - Bonev, I. B.

    AU - Franek, O.

    AU - Pedersen, G. F.

    PY - 2019

    Y1 - 2019

    KW - Numerical models

    KW - Electromagnetic compatibility

    KW - Microstrip

    KW - Integrated circuit modeling

    KW - Resonant frequency

    KW - Predictive models

    KW - Electromagnetic simulations

    KW - Huygen’s box method

    KW - near-field scan

    KW - surface equivalence principle

    U2 - 10.1109/TEMC.2019.2908354

    DO - 10.1109/TEMC.2019.2908354

    M3 - Journal article

    JO - I E E E Transactions on Electromagnetic Compatibility

    JF - I E E E Transactions on Electromagnetic Compatibility

    SN - 0018-9375

    ER -