Broadband Dielectric Characterization of Glasses and Other Silicates up to the THz Frequencies

Rocio Rodriguez-Cano, Michael Lanagan, Steven Perini, Xiaojiang Li, Venkatraman Gopalan

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

3 Citations (Scopus)

Abstract

The dielectric characterization of silicate materials up to 2.5 THz is presented in this paper, to try to fill up the THz gap between electrical and optical measurements. Several measurement techniques have been employed to provide a broadband response. Materials in the silicate family can be classified as amorphous or crystalline. The internal structure, as well as the composition of the material, influences the dielectric properties. The loss of a material depends on its crystallinity, with higher crystallinity exhibiting lower loss.
Original languageEnglish
Title of host publication2023 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, AP-S/URSI 2023 - Proceedings
Number of pages2
PublisherIEEE
Publication date7 Sept 2023
Pages287-288
ISBN (Print)978-1-6654-4227-5, 978-1-6654-4229-9
ISBN (Electronic)978-1-6654-4228-2
DOIs
Publication statusPublished - 7 Sept 2023
Event2023 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (USNC-URSI) - Portland, Portland, United States
Duration: 23 Jul 202328 Jul 2023

Conference

Conference2023 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (USNC-URSI)
LocationPortland
Country/TerritoryUnited States
CityPortland
Period23/07/202328/07/2023
SeriesI E E E Antennas and Propagation Society. International Symposium
ISSN1522-3965

Keywords

  • dielectric
  • chacterization
  • properties
  • broadband
  • THz
  • THz-TDS
  • Silicates
  • 5G
  • 6G

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