Calorimetric measurement methodology for comprehensive soft and hard switching loss characterisation

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Abstract

Accurate measurement of soft and hard switching losses is challenging. Electrical methods are prone to errors and calorimetric measurements most often cannot separate turn-on and turn-off energies. We present a calorimetric test setup capable of measuring and separating turn-on and turn-off energies in soft and hard switching regimes. The resulting loss map can be used to accurately predict power semiconductor losses, even when the converter is not fully in the soft-switching regime.
Original languageEnglish
Title of host publication2023 IEEE Energy Conversion Congress and Exposition, ECCE 2023
Number of pages5
PublisherIEEE
Publication date29 Oct 2023
Pages5789-5793
Article number10362588
ISBN (Electronic)9798350316445
DOIs
Publication statusPublished - 29 Oct 2023
Event2023 IEEE Energy Conversion Congress and Exposition (ECCE) - Nashville, United States
Duration: 29 Oct 20232 Nov 2023
https://www.ieee-ecce.org/2023/

Conference

Conference2023 IEEE Energy Conversion Congress and Exposition (ECCE)
Country/TerritoryUnited States
CityNashville
Period29/10/202302/11/2023
Internet address
SeriesIEEE Energy Conversion Congress and Exposition
ISSN2329-3721

Keywords

  • calorimetry
  • power MOSFET
  • power transistors
  • soft switching
  • switching loss
  • zero voltage switching

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