Defect-free GeSn alloy strips on Si by Sn self-catalyzed MBE method

K. Yu, D. L. Zhang, H. Cong, X. Zhang, Y. Zhao, B. W. Cheng, C. B. Li

Research output: Contribution to book/anthology/report/conference proceedingArticle in proceedingResearchpeer-review

3 Citations (Scopus)

Abstract

The lateral growth of GeSn strips on Si(111) has been successfully achieved by Sn self-catalyzed MBE method. The effect of Sn catalysts on morphology and the quality of the materials were studied. The high quality GeSn on Si will contribute to development of Si-based optoelectronics.

Original languageEnglish
Title of host publication2016 IEEE 13th International Conference on Group IV Photonics, GFP 2016
Number of pages2
PublisherIEEE Computer Society Press
Publication date8 Nov 2016
Pages34-35
Article number7739080
ISBN (Electronic)9781509019038
DOIs
Publication statusPublished - 8 Nov 2016
Event13th IEEE International Conference on Group IV Photonics, GFP 2016 - Shanghai, China
Duration: 24 Aug 201626 Aug 2016

Conference

Conference13th IEEE International Conference on Group IV Photonics, GFP 2016
Country/TerritoryChina
CityShanghai
Period24/08/201626/08/2016
SponsorIntel, Luceda Photonics, Lumerical Solutions, Inc., Synopsys Inc.
SeriesIEEE International Conference on Group IV Photonics GFP
Volume2016-November
ISSN1949-2081

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

Keywords

  • GeSn
  • MBE
  • Si-based
  • Sn self-catalyzed

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