Degradation Analysis of Planar Magnetics

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Abstract

This paper presents the degradation testing results of a type of planar transformer under accelerated thermal conditions. The likely failure mechanisms are analyzed.
Thermal-related degradation models and lifetime models are obtained based on certain end-of-life criteria and assumptions.
Original languageEnglish
Title of host publication2020 IEEE Applied Power Electronics Conference and Exposition (APEC)
Number of pages7
PublisherIEEE
Publication dateJun 2020
Pages2687-2693
Article number9124586
ISBN (Electronic)978-1-7281-4829-8
DOIs
Publication statusPublished - Jun 2020
Event2020 IEEE Applied Power Electronics Conference and Exposition (APEC) - New Orleans, LA, United States
Duration: 15 Mar 202019 Mar 2020

Conference

Conference2020 IEEE Applied Power Electronics Conference and Exposition (APEC)
CountryUnited States
CityNew Orleans, LA
Period15/03/202019/03/2020
SeriesI E E E Applied Power Electronics Conference and Exposition. Conference Proceedings
ISSN1048-2334

Keywords

  • Planar transformer
  • Magnetic core
  • winding
  • Degradation
  • Lifetime model
  • Reliability

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