Degradation Assessment and Precursor Identification for SiC MOSFETs under High Temp Cycling

Engineering

• Metal-Oxide-Semiconductor Field-Effect Transistor 100%
• Aging 100%
• Early Stage 33%
• Reliability Analysis 33%
• Field Data 33%
• Datasheet 33%
• Diode Voltage 33%
• Critical System 33%
• Mosfets 33%
• Catastrophic Failure 33%
• High Temperature Applications 33%
• High Temperature Operations 33%
• Gate Oxide 33%
• Operation Temperature 33%
• Power Mosfets 33%
• Si Device 33%
• Failure (Mechanical) 33%
• Accident Prevention 33%