Drone-Based Daylight Electroluminescence Imaging of PV Modules

Gisele Alves dos Reis Benatto, Claire Mantel, Sergiu Viorel Spataru, Adrian A. Santamaria Lancia, Nicholas Riedel, Sune Thorsteinsson, Peter Behrensdorff Poulsen, Harsh Rajesh Parikh, Søren Forchhammer, Dezso Séra

Research output: Contribution to journalConference article in JournalResearchpeer-review

45 Citations (Scopus)
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Abstract

Electroluminescence (EL) imaging is a photovoltaic (PV) module characterization technique, which provides high accuracy in detecting defects and faults, such as cracks, broken cells interconnections, shunts, among many others; furthermore, the EL technique is used extensively due to a high level of detail and direct relationship to injected carrier density. However, this technique is commonly practiced only indoors - or outdoors from dusk to dawn - because the crystalline silicon luminescence signal is several orders of magnitude lower than sunlight. This limits the potential of such a powerful technique to be used in utility scale inspections, and therefore, the interest in the development of electrical biasing tools to make outdoor EL imaging truly fast and efficient. With the focus of quickly acquiring EL images in daylight, we present in this article a drone-based system capable of acquiring EL images at a frame rate of 120 frames per second. In a single second during high irradiance conditions, this system can capture enough EL and background image pairs to create an EL PV module image that has sufficient diagnostic information to identify faults associated with power loss. The final EL images shown in this work reached representative quality SNR AVG of 4.6, obtained with algorithms developed in previous works. These drone-based EL images were acquired with global horizontal solar irradiance close to one sun in the plane of the array.

Original languageEnglish
Article number9042865
JournalI E E E Journal of Photovoltaics
Volume10
Issue number3
Pages (from-to)872-877
Number of pages6
ISSN2156-3381
DOIs
Publication statusPublished - May 2020
Event 46th IEEE Photovoltaic Specialist Conference - Chicago, United States
Duration: 16 Jun 201921 Jun 2019
Conference number: 46
https://www.ieee-pvsc.org/PVSC46/

Conference

Conference 46th IEEE Photovoltaic Specialist Conference
Number46
Country/TerritoryUnited States
CityChicago
Period16/06/201921/06/2019
Internet address

Keywords

  • Characterization of defects in PV
  • crystalline silicon PV
  • electroluminescence (EL)
  • imaging
  • photovoltaic cells

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