Duty Cycle based Condition Monitoring of MOSFETs in Digitally-Controlled DC-DC Converters

yingzhou peng; Huai Wang

doi:10.1109/APEC39645.2020.9124403

Duty Cycle based Condition Monitoring of MOSFETs in Digitally-Controlled DC-DC Converters

yingzhou peng, Huai Wang

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

3 Citations (Scopus)

Abstract

In this work, a duty cycle ratio-based condition monitoring method is proposed for the MOSFETs in digitally-controlled DC-DC power converters. It is demonstrated and proved with an example of buck converter. Theoretically, the average value of duty cycle ratio is positively related to the on-state resistance of MOSFET. Therefore, the proposed method enables the condition monitoring of the degradation of MOSFET. The impact of other factors, such as input voltage, temperature, loading and other components in buck converter, on the duty cycle ratio is also investigated. Experimental tests are performed in different situations. Both theoretical and experimental results indicate the feasibility of the proposed method for DC-DC converter applications. Compare to the conventional methods, the proposed method features non-invasive, without additional hardware and easily implementing.

Original language	English
Title of host publication	2020 IEEE Applied Power Electronics Conference and Exposition (APEC)
Number of pages	6
Publisher	IEEE
Publication date	Jun 2020
Pages	364-369
Article number	9124403
ISBN (Electronic)	9781728148298
DOIs	https://doi.org/10.1109/APEC39645.2020.9124403
Publication status	Published - Jun 2020
Event	2020 IEEE Applied Power Electronics Conference and Exposition (APEC) - New Orleans, LA, United States Duration: 15 Mar 2020 → 19 Mar 2020

Conference

Conference	2020 IEEE Applied Power Electronics Conference and Exposition (APEC)
Country/Territory	United States
City	New Orleans, LA
Period	15/03/2020 → 19/03/2020

Series	35th Annual IEEE Applied Power Electronics Conference & Exposition (APEC 2020)

Keywords

Condition Monitoring
DC-DC Power Converter
On-line
Power MOSFET

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10.1109/APEC39645.2020.9124403

AUB Link

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Cite this

@inproceedings{3198a1660d684b5fae55700f0b6d774e,

title = "Duty Cycle based Condition Monitoring of MOSFETs in Digitally-Controlled DC-DC Converters",

abstract = "In this work, a duty cycle ratio-based condition monitoring method is proposed for the MOSFETs in digitally-controlled DC-DC power converters. It is demonstrated and proved with an example of buck converter. Theoretically, the average value of duty cycle ratio is positively related to the on-state resistance of MOSFET. Therefore, the proposed method enables the condition monitoring of the degradation of MOSFET. The impact of other factors, such as input voltage, temperature, loading and other components in buck converter, on the duty cycle ratio is also investigated. Experimental tests are performed in different situations. Both theoretical and experimental results indicate the feasibility of the proposed method for DC-DC converter applications. Compare to the conventional methods, the proposed method features non-invasive, without additional hardware and easily implementing.",

keywords = "Condition Monitoring, DC-DC Power Converter, On-line, Power MOSFET",

author = "yingzhou peng and Huai Wang",

year = "2020",

month = jun,

doi = "10.1109/APEC39645.2020.9124403",

language = "English",

series = "35th Annual IEEE Applied Power Electronics Conference & Exposition (APEC 2020)",

pages = "364--369",

booktitle = "2020 IEEE Applied Power Electronics Conference and Exposition (APEC)",

publisher = "IEEE",

address = "United States",

note = "2020 IEEE Applied Power Electronics Conference and Exposition (APEC) ; Conference date: 15-03-2020 Through 19-03-2020",

}

peng, Y & Wang, H 2020, Duty Cycle based Condition Monitoring of MOSFETs in Digitally-Controlled DC-DC Converters. in 2020 IEEE Applied Power Electronics Conference and Exposition (APEC)., 9124403, IEEE, 35th Annual IEEE Applied Power Electronics Conference & Exposition (APEC 2020), pp. 364-369, 2020 IEEE Applied Power Electronics Conference and Exposition (APEC), New Orleans, LA, United States, 15/03/2020. https://doi.org/10.1109/APEC39645.2020.9124403

Duty Cycle based Condition Monitoring of MOSFETs in Digitally-Controlled DC-DC Converters. / peng, yingzhou; Wang, Huai.
2020 IEEE Applied Power Electronics Conference and Exposition (APEC). IEEE, 2020. p. 364-369 9124403 (35th Annual IEEE Applied Power Electronics Conference & Exposition (APEC 2020)).

Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review

TY - GEN

T1 - Duty Cycle based Condition Monitoring of MOSFETs in Digitally-Controlled DC-DC Converters

AU - peng, yingzhou

AU - Wang, Huai

PY - 2020/6

Y1 - 2020/6

N2 - In this work, a duty cycle ratio-based condition monitoring method is proposed for the MOSFETs in digitally-controlled DC-DC power converters. It is demonstrated and proved with an example of buck converter. Theoretically, the average value of duty cycle ratio is positively related to the on-state resistance of MOSFET. Therefore, the proposed method enables the condition monitoring of the degradation of MOSFET. The impact of other factors, such as input voltage, temperature, loading and other components in buck converter, on the duty cycle ratio is also investigated. Experimental tests are performed in different situations. Both theoretical and experimental results indicate the feasibility of the proposed method for DC-DC converter applications. Compare to the conventional methods, the proposed method features non-invasive, without additional hardware and easily implementing.

AB - In this work, a duty cycle ratio-based condition monitoring method is proposed for the MOSFETs in digitally-controlled DC-DC power converters. It is demonstrated and proved with an example of buck converter. Theoretically, the average value of duty cycle ratio is positively related to the on-state resistance of MOSFET. Therefore, the proposed method enables the condition monitoring of the degradation of MOSFET. The impact of other factors, such as input voltage, temperature, loading and other components in buck converter, on the duty cycle ratio is also investigated. Experimental tests are performed in different situations. Both theoretical and experimental results indicate the feasibility of the proposed method for DC-DC converter applications. Compare to the conventional methods, the proposed method features non-invasive, without additional hardware and easily implementing.

KW - Condition Monitoring

KW - DC-DC Power Converter

KW - On-line

KW - Power MOSFET

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DO - 10.1109/APEC39645.2020.9124403

M3 - Article in proceeding

T3 - 35th Annual IEEE Applied Power Electronics Conference & Exposition (APEC 2020)

SP - 364

EP - 369

BT - 2020 IEEE Applied Power Electronics Conference and Exposition (APEC)

PB - IEEE

T2 - 2020 IEEE Applied Power Electronics Conference and Exposition (APEC)

Y2 - 15 March 2020 through 19 March 2020

ER -

Duty Cycle based Condition Monitoring of MOSFETs in Digitally-Controlled DC-DC Converters

Abstract

Conference

Keywords

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AUB Link

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Advanced Converter-level Condition Monitoring for Power Electronics Components

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